4point_probe

Four point probe is used to measure resistive properties of semiconductor wafers and thin films [1].

In this case are studing the I - V characteristic of an element depending on the temperature of the sample. It is important to understand the I – V characteristic near the metal-insulator phase transition (MIT), which is about 68 degrees Celsius. You must understand that the ultimate goal is to stabilize the temperature to a specific value. More about the TEC control [2].