diff --git a/chameo.properties b/chameo.properties index ed14a5c..c64bf64 100644 --- a/chameo.properties +++ b/chameo.properties @@ -1,4 +1,4 @@ -#Tue Oct 29 18:38:23 CET 2024 +#Thu Oct 31 11:39:58 CET 2024 jdbc.password= jdbc.user= jdbc.url= diff --git a/chameo.ttl b/chameo.ttl index 72b79ed..a606a64 100644 --- a/chameo.ttl +++ b/chameo.ttl @@ -15,54 +15,54 @@ @base . rdf:type owl:Ontology ; - owl:versionIRI ; - owl:imports , - , - , - , - , - , - , - , - , - , - , - , - ; - dcterms:abstract "CHAMEO is a domain ontology designed to model the common aspects across the different characterisation techniques and methodologies."@en ; - dcterms:alternative "CHAMEO" ; - dcterms:bibliographicCitation "Del Nostro, P., Goldbeck, G., Toti, D., 2022. CHAMEO: An ontology for the harmonisation of materials characterisation methodologies. Applied Ontology 17, 401–421. doi:10.3233/AO-220271." ; - dcterms:contributor , - , - ; - dcterms:created "2021-12-20" ; - dcterms:creator , - , - ; - dcterms:description "Characterisation Methodology Ontology"@en ; - dcterms:hasFormat ; - dcterms:identifier "https://w3id.org/emmo/domain/domain-chameo/chameo" ; - dcterms:issued "2024-04-12" ; - dcterms:license "https://creativecommons.org/licenses/by/4.0/legalcode" ; - dcterms:modified "2024-04-12" ; - dcterms:publisher "EMMC ASBL" ; - dcterms:source "" ; - dcterms:title "CHAracterisation MEthodology Ontology"@en ; - bibo:doi "" ; - bibo:status "" ; - vann:preferredNamespacePrefix "chameo"@en ; - vann:preferredNamespaceUri "https://w3id.org/emmo/domain/domain-chameo/chameo" ; - rdfs:comment """Contacts: + owl:versionIRI ; + owl:imports , + , + , + , + , + , + , + , + , + , + , + , + ; + dcterms:abstract "CHAMEO is a domain ontology designed to model the common aspects across the different characterisation techniques and methodologies."@en ; + dcterms:alternative "CHAMEO" ; + dcterms:bibliographicCitation "Del Nostro, P., Goldbeck, G., Toti, D., 2022. CHAMEO: An ontology for the harmonisation of materials characterisation methodologies. Applied Ontology 17, 401–421. doi:10.3233/AO-220271." ; + dcterms:contributor , + , + ; + dcterms:created "2021-12-20" ; + dcterms:creator , + , + ; + dcterms:description "Characterisation Methodology Ontology"@en ; + dcterms:hasFormat ; + dcterms:identifier "https://w3id.org/emmo/domain/domain-chameo/chameo" ; + dcterms:issued "2024-04-12" ; + dcterms:license "https://creativecommons.org/licenses/by/4.0/legalcode" ; + dcterms:modified "2024-04-12" ; + dcterms:publisher "EMMC ASBL" ; + dcterms:source "" ; + dcterms:title "CHAracterisation MEthodology Ontology"@en ; + bibo:doi "" ; + bibo:status "" ; + vann:preferredNamespacePrefix "chameo"@en ; + vann:preferredNamespaceUri "https://w3id.org/emmo/domain/domain-chameo/chameo" ; + rdfs:comment """Contacts: Gerhard Goldbeck Goldbeck Consulting Ltd (UK) email: gerhard@goldbeck-consulting.com"""@en ; - owl:backwardCompatibleWith "" ; - owl:priorVersion "1.0.0-beta2" ; - owl:versionInfo "1.0.0-beta3" ; - skos:hiddenLabel "CHAMEO" ; - foaf:homepage ; - foaf:logo "https://raw.githubusercontent.com/emmo-repo/domain-characterisation-methodology/main/images/chameo_logo_small.png" ; - foaf:page . + owl:backwardCompatibleWith "" ; + owl:priorVersion "1.0.0-beta2" ; + owl:versionInfo "1.0.0-beta3" ; + skos:hiddenLabel "CHAMEO" ; + foaf:homepage ; + foaf:logo "https://raw.githubusercontent.com/emmo-repo/domain-chameo/main/images/chameo_logo_small.png" ; + foaf:page . ################################################################# # Annotation properties @@ -140,7 +140,7 @@ foaf:page rdf:type owl:AnnotationProperty . # Object Properties ################################################################# -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasAccessConditions +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasAccessConditions chameo:hasAccessConditions rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationTechnique ; @@ -150,19 +150,19 @@ chameo:hasAccessConditions rdf:type owl:ObjectProperty ; skos:prefLabel "hasAccessConditions"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasBeginCharacterisationTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasBeginCharacterisationTask chameo:hasBeginCharacterisationTask rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_4ab7fb52_cec3_4c00_90c0_5648f01e3296 ; rdfs:domain chameo:CharacterisationWorkflow ; rdfs:range chameo:CharacterisationTask . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationComponent +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationComponent chameo:hasCharacterisationComponent rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_3c7f239f_e833_4a2b_98a1_c88831770c1b . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationEnvironment +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationEnvironment chameo:hasCharacterisationEnvironment rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationProcedure ; @@ -172,7 +172,7 @@ chameo:hasCharacterisationEnvironment rdf:type owl:ObjectProperty ; skos:prefLabel "hasCharacterisationEnvironment"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationEnvironmentProperty +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationEnvironmentProperty chameo:hasCharacterisationEnvironmentProperty rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationEnvironment ; @@ -182,24 +182,24 @@ chameo:hasCharacterisationEnvironmentProperty rdf:type owl:ObjectProperty ; skos:prefLabel "hasCharacterisationEnvironmentProperty"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationInput +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationInput chameo:hasCharacterisationInput rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_36e69413_8c59_4799_946c_10b05d266e22 . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationMeasurementInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationMeasurementInstrument chameo:hasCharacterisationMeasurementInstrument rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:CharacterisationMeasurementProcess ; rdfs:range chameo:CharacterisationMeasurementInstrument . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationOutput +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationOutput chameo:hasCharacterisationOutput rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_c4bace1d_4db0_4cd3_87e9_18122bae2840 . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationProcedureValidation +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationProcedureValidation chameo:hasCharacterisationProcedureValidation rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationTechnique ; @@ -209,7 +209,7 @@ chameo:hasCharacterisationProcedureValidation rdf:type owl:ObjectProperty ; skos:prefLabel "hasCharacterisationProcedureValidation"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationProperty +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationProperty chameo:hasCharacterisationProperty rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_fd689787_31b0_41cf_bf03_0d69af76469d ; rdfs:domain chameo:Sample ; @@ -219,7 +219,7 @@ chameo:hasCharacterisationProperty rdf:type owl:ObjectProperty ; skos:prefLabel "hasCharacterisationProperty"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationSoftware +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationSoftware chameo:hasCharacterisationSoftware rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:range chameo:CharacterisationSoftware ; @@ -228,14 +228,14 @@ chameo:hasCharacterisationSoftware rdf:type owl:ObjectProperty ; skos:prefLabel "hasCharacterisationSoftware"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasCharacterisationTask chameo:hasCharacterisationTask rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_70da982d_1810_4b01_9630_a28e216ecd9a ; rdfs:domain chameo:CharacterisationWorkflow ; rdfs:range chameo:CharacterisationTask . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataAcquisitionRate +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasDataAcquisitionRate chameo:hasDataAcquisitionRate rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:RawData ; @@ -245,7 +245,7 @@ chameo:hasDataAcquisitionRate rdf:type owl:ObjectProperty ; skos:prefLabel "hasDataAcquisitionRate"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataProcessingThroughCalibration +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasDataProcessingThroughCalibration chameo:hasDataProcessingThroughCalibration rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationMeasurementProcess ; @@ -255,7 +255,7 @@ chameo:hasDataProcessingThroughCalibration rdf:type owl:ObjectProperty ; skos:prefLabel "hasDataProcessingThroughCalibration"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataQuality +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasDataQuality chameo:hasDataQuality rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:MeasurementDataPostProcessing ; @@ -265,7 +265,7 @@ chameo:hasDataQuality rdf:type owl:ObjectProperty ; skos:prefLabel "hasDataQuality"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataset +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasDataset chameo:hasDataset rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_60577dea_9019_4537_ac41_80b0fb563d41 ; rdfs:range emmo:EMMO_194e367c_9783_4bf5_96d0_9ad597d48d9a ; @@ -274,14 +274,14 @@ chameo:hasDataset rdf:type owl:ObjectProperty ; skos:prefLabel "hasDataset"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasEndCharacterisationTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasEndCharacterisationTask chameo:hasEndCharacterisationTask rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_92227f7f_22e9_4b19_a011_920eac3c7b75 ; rdfs:domain chameo:CharacterisationWorkflow ; rdfs:range chameo:CharacterisationTask . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHardwareSpecification +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasHardwareSpecification chameo:hasHardwareSpecification rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationHardware ; @@ -291,7 +291,7 @@ chameo:hasHardwareSpecification rdf:type owl:ObjectProperty ; skos:prefLabel "hasHardwareSpecification"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHazard +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasHazard chameo:hasHazard rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:range chameo:Hazard ; @@ -300,7 +300,7 @@ chameo:hasHazard rdf:type owl:ObjectProperty ; skos:prefLabel "hasHazard"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHolder +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasHolder chameo:hasHolder rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:SamplePreparation ; @@ -310,14 +310,14 @@ chameo:hasHolder rdf:type owl:ObjectProperty ; skos:prefLabel "hasHolder"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInstrumentForCalibration +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasInstrumentForCalibration chameo:hasInstrumentForCalibration rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:CalibrationProcess ; rdfs:range chameo:CharacterisationMeasurementInstrument . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionVolume +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasInteractionVolume chameo:hasInteractionVolume rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_ae2d1a96_bfa1_409a_a7d2_03d69e8a125a ; rdfs:domain chameo:ProbeSampleInteraction ; @@ -327,7 +327,7 @@ chameo:hasInteractionVolume rdf:type owl:ObjectProperty ; skos:prefLabel "hasInteractionVolume"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionWithProbe +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasInteractionWithProbe chameo:hasInteractionWithProbe rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_ae2d1a96_bfa1_409a_a7d2_03d69e8a125a ; rdfs:domain chameo:ProbeSampleInteraction ; @@ -337,7 +337,7 @@ chameo:hasInteractionWithProbe rdf:type owl:ObjectProperty ; skos:prefLabel "hasInteractionWithProbe"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionWithSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasInteractionWithSample chameo:hasInteractionWithSample rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:ProbeSampleInteraction ; @@ -347,7 +347,7 @@ chameo:hasInteractionWithSample rdf:type owl:ObjectProperty ; skos:prefLabel "hasInteractionWithSample"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasLab +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasLab chameo:hasLab rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:range chameo:Laboratory ; @@ -356,7 +356,7 @@ chameo:hasLab rdf:type owl:ObjectProperty ; skos:prefLabel "hasLab"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasLevelOfAutomation +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasLevelOfAutomation chameo:hasLevelOfAutomation rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationTechnique ; @@ -366,7 +366,7 @@ chameo:hasLevelOfAutomation rdf:type owl:ObjectProperty ; skos:prefLabel "hasLevelOfAutomation"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementDetector +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasMeasurementDetector chameo:hasMeasurementDetector rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:range chameo:Detector ; @@ -375,7 +375,7 @@ chameo:hasMeasurementDetector rdf:type owl:ObjectProperty ; skos:prefLabel "hasMeasurementDetector"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasMeasurementParameter chameo:hasMeasurementParameter rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_36e69413_8c59_4799_946c_10b05d266e22 ; rdfs:domain chameo:CharacterisationMeasurementProcess ; @@ -385,7 +385,7 @@ chameo:hasMeasurementParameter rdf:type owl:ObjectProperty ; skos:prefLabel "hasMeasurementParameter"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementProbe +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasMeasurementProbe chameo:hasMeasurementProbe rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:range chameo:Probe ; @@ -394,7 +394,7 @@ chameo:hasMeasurementProbe rdf:type owl:ObjectProperty ; skos:prefLabel "hasMeasurementProbe"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasMeasurementSample chameo:hasMeasurementSample rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:CharacterisationMeasurementProcess ; @@ -404,7 +404,7 @@ chameo:hasMeasurementSample rdf:type owl:ObjectProperty ; skos:prefLabel "hasMeasurementSample"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementTime +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasMeasurementTime chameo:hasMeasurementTime rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:CharacterisationMeasurementProcess ; @@ -414,7 +414,7 @@ chameo:hasMeasurementTime rdf:type owl:ObjectProperty ; skos:prefLabel "hasMeasurementTime"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasOperator +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasOperator chameo:hasOperator rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_cd24eb82_a11c_4a31_96ea_32f870c5580a ; rdfs:range chameo:Operator ; @@ -423,7 +423,7 @@ chameo:hasOperator rdf:type owl:ObjectProperty ; skos:prefLabel "hasOperator"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPeerReviewedArticle +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasPeerReviewedArticle chameo:hasPeerReviewedArticle rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_eb3518bf_f799_4f9e_8c3e_ce59af11453b ; rdfs:domain chameo:CharacterisationProcedureValidation ; @@ -433,7 +433,7 @@ chameo:hasPeerReviewedArticle rdf:type owl:ObjectProperty ; skos:prefLabel "hasPeerReviewedArticle"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPhysicsOfInteraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasPhysicsOfInteraction chameo:hasPhysicsOfInteraction rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_24c71baf_6db6_48b9_86c8_8c70cf36db0c ; rdfs:domain chameo:ProbeSampleInteraction ; @@ -443,7 +443,7 @@ chameo:hasPhysicsOfInteraction rdf:type owl:ObjectProperty ; skos:prefLabel "hasPhysicsOfInteraction"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPostProcessingModel +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasPostProcessingModel chameo:hasPostProcessingModel rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:MeasurementDataPostProcessing ; @@ -453,7 +453,7 @@ chameo:hasPostProcessingModel rdf:type owl:ObjectProperty ; skos:prefLabel "hasPostProcessingModel"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasProcessingReproducibility +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasProcessingReproducibility chameo:hasProcessingReproducibility rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:domain chameo:MeasurementDataPostProcessing ; @@ -463,21 +463,21 @@ chameo:hasProcessingReproducibility rdf:type owl:ObjectProperty ; skos:prefLabel "hasProcessingReproducibility"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasReferenceSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasReferenceSample chameo:hasReferenceSample rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:CalibrationProcess ; rdfs:range chameo:ReferenceSample . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleForInspection +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSampleForInspection chameo:hasSampleForInspection rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:SampleInspection ; rdfs:range chameo:Sample . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleForPreparation +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSampleForPreparation chameo:hasSampleForPreparation rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:SamplePreparation ; @@ -487,36 +487,27 @@ chameo:hasSampleForPreparation rdf:type owl:ObjectProperty ; skos:prefLabel "hasSampleBeforeSamplePreparation"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleInspectionInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSampleInspectionInstrument chameo:hasSampleInspectionInstrument rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:SampleInspection . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleInspectionParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSampleInspectionParameter chameo:hasSampleInspectionParameter rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_36e69413_8c59_4799_946c_10b05d266e22 ; rdfs:domain chameo:SampleInspection ; rdfs:range chameo:SampleInspectionParameter . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSamplePreparationHardware -chameo:hasSamplePreparationHardware rdf:type owl:ObjectProperty ; - rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; - rdfs:range chameo:SamplePreparationHardware ; - rdfs:comment "" ; - rdfs:label "hasSamplePreparationHardware"@en ; - skos:prefLabel "hasSamplePreparationHardware"@en . - - -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSamplePreparationInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSamplePreparationInstrument chameo:hasSamplePreparationInstrument rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_35c29eb6_f57e_48d8_85af_854f9e926e77 ; rdfs:domain chameo:SamplePreparation ; rdfs:range chameo:SamplePreparationInstrument . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSamplePreparationParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSamplePreparationParameter chameo:hasSamplePreparationParameter rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_36e69413_8c59_4799_946c_10b05d266e22 ; rdfs:domain chameo:SamplePreparation ; @@ -526,7 +517,7 @@ chameo:hasSamplePreparationParameter rdf:type owl:ObjectProperty ; skos:prefLabel "hasSamplePreparationParameter"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampledSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasSampledSample chameo:hasSampledSample rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_c4bace1d_4db0_4cd3_87e9_18122bae2840 ; rdfs:domain chameo:SamplingProcess ; @@ -536,7 +527,7 @@ chameo:hasSampledSample rdf:type owl:ObjectProperty ; skos:prefLabel "hasSampledSample"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#requiresLevelOfExpertise +### https://w3id.org/emmo/domain/domain-chameo/chameo#requiresLevelOfExpertise chameo:requiresLevelOfExpertise rdf:type owl:ObjectProperty ; rdfs:subPropertyOf emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; rdfs:range chameo:LevelOfExpertise ; @@ -545,7 +536,7 @@ chameo:requiresLevelOfExpertise rdf:type owl:ObjectProperty ; skos:prefLabel "requiresLevelOfExpertise"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#userCaseHasCharacterisationProcedure +### https://w3id.org/emmo/domain/domain-chameo/chameo#userCaseHasCharacterisationProcedure chameo:userCaseHasCharacterisationProcedure rdf:type owl:ObjectProperty ; rdfs:subPropertyOf owl:topObjectProperty ; rdfs:domain chameo:UserCase ; @@ -567,28 +558,28 @@ chameo:userCaseHasCharacterisationProcedure rdf:type owl:ObjectProperty ; skos:prefLabel "hasDateOfCalibration"@en . -### https://w3id.org/emmo/domain/domain-nanoindentation/nanoindentatio#hasManufacturer - rdf:type owl:DatatypeProperty ; - rdfs:subPropertyOf owl:topDataProperty ; - rdfs:domain chameo:CharacterisationHardware ; - rdfs:range xsd:string ; - emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the Manufacturer of a CharacterisationHardware" . +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasManufacturer +chameo:hasManufacturer rdf:type owl:DatatypeProperty ; + rdfs:subPropertyOf owl:topDataProperty ; + rdfs:domain chameo:CharacterisationHardware ; + rdfs:range xsd:string ; + emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the Manufacturer of a CharacterisationHardware" . -### https://w3id.org/emmo/domain/domain-nanoindentation/nanoindentatio#hasModel - rdf:type owl:DatatypeProperty ; - rdfs:subPropertyOf owl:topDataProperty ; - rdfs:domain chameo:CharacterisationHardware ; - rdfs:range xsd:string ; - emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the model of a CharacterisationHardware"@en . +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasModel +chameo:hasModel rdf:type owl:DatatypeProperty ; + rdfs:subPropertyOf owl:topDataProperty ; + rdfs:domain chameo:CharacterisationHardware ; + rdfs:range xsd:string ; + emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the model of a CharacterisationHardware"@en . -### https://w3id.org/emmo/domain/domain-nanoindentation/nanoindentatio#hasUniqueID - rdf:type owl:DatatypeProperty ; - rdfs:subPropertyOf owl:topDataProperty ; - rdfs:domain chameo:CharacterisationHardware ; - rdfs:range xsd:string ; - emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the UniqueID of a CharacterisationHardware" . +### https://w3id.org/emmo/domain/domain-chameo/chameo#hasUniqueID +chameo:hasUniqueID rdf:type owl:DatatypeProperty ; + rdfs:subPropertyOf owl:topDataProperty ; + rdfs:domain chameo:CharacterisationHardware ; + rdfs:range xsd:string ; + emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A string representing the UniqueID of a CharacterisationHardware" . ################################################################# @@ -607,7 +598,11 @@ foaf:Person rdf:type owl:Class ; skos:prefLabel "Person" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ACVoltammetry +### https://w3id.org/emmo#EMMO_e94a9156_fb6c_4e16_88ee_829ac9933155 +emmo:EMMO_e94a9156_fb6c_4e16_88ee_829ac9933155 owl:disjointWith chameo:Rationale . + + +### https://w3id.org/emmo/domain/domain-chameo/chameo#ACVoltammetry chameo:ACVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "The resulting alternating current is plotted versus imposed DC potential. The obtained AC voltammogram is peak-shaped."@en , @@ -620,7 +615,7 @@ chameo:ACVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AbrasiveStrippingVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#AbrasiveStrippingVoltammetry chameo:AbrasiveStrippingVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "electrochemical method where traces of solid particles are abrasively transferred onto the surface of an electrode, followed by an electrochemical dissolution (anodic or cathodic dissolution) that is recorded as a current–voltage curve"@en , @@ -637,7 +632,7 @@ chameo:AbrasiveStrippingVoltammetry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AccessConditions +### https://w3id.org/emmo/domain/domain-chameo/chameo#AccessConditions chameo:AccessConditions rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_909415d1_7c43_4d5e_bbeb_7e1910159f66 ; rdfs:comment "" ; @@ -649,7 +644,7 @@ chameo:AccessConditions rdf:type owl:Class ; "Was the access to your sample preparation an inhouse routine or required a 3rd party service?"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AdsorptiveStrippingVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#AdsorptiveStrippingVoltammetry chameo:AdsorptiveStrippingVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:StrippingVoltammetry ; rdfs:comment "A peak-shaped adsorptive stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution."@en , @@ -662,7 +657,7 @@ chameo:AdsorptiveStrippingVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AlphaSpectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#AlphaSpectrometry chameo:AlphaSpectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:Spectrometry ; rdfs:comment "" ; @@ -671,7 +666,7 @@ chameo:AlphaSpectrometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Alpha spectrometry (also known as alpha(-particle) spectroscopy) is the quantitative study of the energy of alpha particles emitted by a radioactive nuclide that is an alpha emitter. As emitted alpha particles are mono-energetic (i.e. not emitted with a spectrum of energies, such as beta decay) with energies often distinct to the decay they can be used to identify which radionuclide they originated from."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Amperometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Amperometry chameo:Amperometry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "Amperometry can be distinguished from voltammetry by the parameter being controlled (electrode potential E) and the parameter being measured (electrode current I which is usually a function of time – see chronoamperometry)."@en , @@ -685,7 +680,7 @@ chameo:Amperometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnalyticalElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#AnalyticalElectronMicroscopy chameo:AnalyticalElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -694,7 +689,7 @@ chameo:AnalyticalElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnodicStrippingVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#AnodicStrippingVoltammetry chameo:AnodicStrippingVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:StrippingVoltammetry ; rdfs:comment "A peak-shaped anodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution."@en , @@ -707,7 +702,7 @@ chameo:AnodicStrippingVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomProbeTomography +### https://w3id.org/emmo/domain/domain-chameo/chameo#AtomProbeTomography chameo:AtomProbeTomography rdf:type owl:Class ; rdfs:subClassOf chameo:Tomography ; rdfs:comment "" ; @@ -720,7 +715,7 @@ chameo:AtomProbeTomography rdf:type owl:Class ; The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#AtomicForceMicroscopy chameo:AtomicForceMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -729,7 +724,7 @@ chameo:AtomicForceMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#BrunauerEmmettTellerMethod +### https://w3id.org/emmo/domain/domain-chameo/chameo#BrunauerEmmettTellerMethod chameo:BrunauerEmmettTellerMethod rdf:type owl:Class ; rdfs:subClassOf chameo:GasAdsorptionPorosimetry ; rdfs:label "BrunauerEmmettTellerMethod"@en ; @@ -740,7 +735,7 @@ chameo:BrunauerEmmettTellerMethod rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/BET_theory" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationData +### https://w3id.org/emmo/domain/domain-chameo/chameo#CalibrationData chameo:CalibrationData rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationData ; rdfs:comment "" ; @@ -749,7 +744,7 @@ chameo:CalibrationData rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Calibration data are used to provide correction of measured data or perform uncertainty calculations. They are generally the result of a measuerement on a reference specimen."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationDataPostProcessing +### https://w3id.org/emmo/domain/domain-chameo/chameo#CalibrationDataPostProcessing chameo:CalibrationDataPostProcessing rdf:type owl:Class ; rdfs:subClassOf chameo:DataPostProcessing ; rdfs:comment "" ; @@ -758,7 +753,7 @@ chameo:CalibrationDataPostProcessing rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Post-processing of the output of the calibration in order to get the actual calibration data to be used as input for the measurement."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationProcess +### https://w3id.org/emmo/domain/domain-chameo/chameo#CalibrationProcess chameo:CalibrationProcess rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure , [ rdf:type owl:Restriction ; @@ -792,7 +787,7 @@ standards. emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "Usually the calibration process involve a reference sample (with pre-defined, specific, and stable physical characteristics and known properties), in order to extract calibration data. In this way, the accuracy of the measurement tool and its components (for example the probe) will be evaluated and confirmed."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#CalibrationTask chameo:CalibrationTask rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTask , [ rdf:type owl:Restriction ; @@ -806,7 +801,7 @@ chameo:CalibrationTask rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Used to break-down a CalibrationProcess into his specific tasks."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Calorimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Calorimetry chameo:Calorimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ThermochemicalTesting ; rdfs:comment "" ; @@ -815,7 +810,7 @@ chameo:Calorimetry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "In chemistry and thermodynamics, calorimetry (from Latin calor 'heat', and Greek μέτρον (metron) 'measure') is the science or act of measuring changes in state variables of a body for the purpose of deriving the heat transfer associated with changes of its state due, for example, to chemical reactions, physical changes, or phase transitions under specified constraints. Calorimetry is performed with a calorimeter."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CathodicStrippingVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#CathodicStrippingVoltammetry chameo:CathodicStrippingVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:StrippingVoltammetry ; rdfs:comment "A peak-shaped cathodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution."@en , @@ -828,12 +823,12 @@ chameo:CathodicStrippingVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationComponent +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationComponent chameo:CharacterisationComponent rdf:type owl:Class ; skos:prefLabel "CharacterisationComponent" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationData +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationData chameo:CharacterisationData rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_3e7add3d_e6ed_489a_a796_8e31fef9b490 ; rdfs:comment "" ; @@ -842,7 +837,7 @@ chameo:CharacterisationData rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Represents every type of data that is produced during a characterisation process"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationDataValidation +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationDataValidation chameo:CharacterisationDataValidation rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_1c7f2dfe_0db4_4bf6_a0f6_853054a34ead ; rdfs:comment "" ; @@ -851,7 +846,7 @@ chameo:CharacterisationDataValidation rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Procedures to validate the characterisation data."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationEnvironment +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationEnvironment chameo:CharacterisationEnvironment rdf:type owl:Class ; rdfs:subClassOf [ rdf:type owl:Restriction ; owl:onProperty emmo:EMMO_e1097637_70d2_4895_973f_2396f04fa204 ; @@ -864,7 +859,7 @@ chameo:CharacterisationEnvironment rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "Characterisation can either be made in air (ambient conditions, without specific controls on environmental parameters), or at different temperatures, different pressures (or in vacuum), or using different types of working gases (inert or reactive with respect to sample), different levels of humidity, etc."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationEnvironmentProperty +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationEnvironmentProperty chameo:CharacterisationEnvironmentProperty rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_b7bcff25_ffc3_474e_9ab5_01b1664bd4ba ; rdfs:comment "" ; @@ -872,7 +867,7 @@ chameo:CharacterisationEnvironmentProperty rdf:type owl:Class ; skos:prefLabel "CharacterisationEnvironmentProperty" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationExperiment +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationExperiment chameo:CharacterisationExperiment rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_22522299_4091_4d1f_82a2_3890492df6db ; rdfs:comment "" ; @@ -881,16 +876,16 @@ chameo:CharacterisationExperiment rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A characterisation experiment is the process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardware +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationHardware chameo:CharacterisationHardware rdf:type owl:Class ; - rdfs:subClassOf emmo:EMMO_86ca9b93_1183_4b65_81b8_c0fcd3bba5ad ; + rdfs:subClassOf emmo:EMMO_494b372c_cfdf_47d3_a4de_5e037c540de8 ; rdfs:comment "" ; rdfs:label "CharacterisationHardware"@en ; skos:prefLabel "CharacterisationHardware"@en ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Whatever hardware is used during the characterisation process."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareManufacturer +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationHardwareManufacturer chameo:CharacterisationHardwareManufacturer rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardwareSpecification ; owl:disjointWith chameo:CharacterisationHardwareModel ; @@ -899,7 +894,7 @@ chameo:CharacterisationHardwareManufacturer rdf:type owl:Class ; skos:prefLabel "HardwareManufacturer"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareModel +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationHardwareModel chameo:CharacterisationHardwareModel rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardwareSpecification ; rdfs:comment "" ; @@ -907,7 +902,7 @@ chameo:CharacterisationHardwareModel rdf:type owl:Class ; skos:prefLabel "HardwareModel"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareSpecification +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationHardwareSpecification chameo:CharacterisationHardwareSpecification rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_b7bcff25_ffc3_474e_9ab5_01b1664bd4ba ; rdfs:comment "" ; @@ -915,10 +910,9 @@ chameo:CharacterisationHardwareSpecification rdf:type owl:Class ; skos:prefLabel "CharacterisationHardwareSpecification"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationMeasurementInstrument chameo:CharacterisationMeasurementInstrument rdf:type owl:Class ; - rdfs:subClassOf emmo:EMMO_494b372c_cfdf_47d3_a4de_5e037c540de8 , - emmo:EMMO_f2d5d3ad_2e00_417f_8849_686f3988d929 , + rdfs:subClassOf emmo:EMMO_f2d5d3ad_2e00_417f_8849_686f3988d929 , chameo:CharacterisationHardware , [ rdf:type owl:Restriction ; owl:onProperty emmo:EMMO_8e52c42b_e879_4473_9fa1_4b23428b392b ; @@ -940,7 +934,7 @@ NOTE 2 A measuring instrument is either an indicating measuring instrument or a emmo:EMMO_bb49844b_45d7_4f0d_8cae_8e552cbc20d6 "Measuring instrument"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementProcess +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationMeasurementProcess chameo:CharacterisationMeasurementProcess rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_463bcfda_867b_41d9_a967_211d4d437cfb , chameo:CharacterisationProcedure , @@ -987,7 +981,7 @@ system specifications. emmo:EMMO_bb49844b_45d7_4f0d_8cae_8e552cbc20d6 "Measurement"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationMeasurementTask chameo:CharacterisationMeasurementTask rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTask , [ rdf:type owl:Restriction ; @@ -1001,7 +995,7 @@ chameo:CharacterisationMeasurementTask rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Used to break-down a CharacterisationMeasurementProcess into his specific tasks."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProcedure +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationProcedure chameo:CharacterisationProcedure rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_472a0ca2_58bf_4618_b561_6fe68bd9fd49 ; rdfs:comment "" ; @@ -1017,7 +1011,7 @@ Data sampling"""@en ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "Characterisation procedure may refer to the full characterisation process or just a part of the full process."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProcedureValidation +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationProcedureValidation chameo:CharacterisationProcedureValidation rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_909415d1_7c43_4d5e_bbeb_7e1910159f66 ; rdfs:comment "" ; @@ -1026,7 +1020,7 @@ chameo:CharacterisationProcedureValidation rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Describes why the characterization procedure was chosen and deemed to be the most useful for the sample."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProperty +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationProperty chameo:CharacterisationProperty rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_873b0ab3_88e6_4054_b901_5531e01f14a4 , chameo:SecondaryData ; @@ -1036,7 +1030,7 @@ chameo:CharacterisationProperty rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The characterisation property is the investigate property or behaviour of a sample. It is derived from the secondary data, usually after classification or quantification (manually or by a model)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProtocol +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationProtocol chameo:CharacterisationProtocol rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure ; rdfs:comment "" ; @@ -1045,7 +1039,7 @@ chameo:CharacterisationProtocol rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A characterisation protocol is defined whenever it is desirable to standardize a laboratory method to ensure successful replication of results by others in the same laboratory or by other laboratories."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationSoftware +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationSoftware chameo:CharacterisationSoftware rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_3b031fa9_8623_4ea5_8b57_bcafb70c5c8b ; rdfs:comment "" ; @@ -1055,7 +1049,7 @@ chameo:CharacterisationSoftware rdf:type owl:Class ; emmo:EMMO_b432d2d5_25f4_4165_99c5_5935a7763c1a "In Nanoindentation post-processing the software used to apply the Oliver-Pharr to calculate the characterisation properties (i.e. elastic modulus, hardness) from load and depth data." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationSystem +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationSystem chameo:CharacterisationSystem rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_65a007dc_2550_46b0_b394_3346c67fbb69 , emmo:EMMO_7dea2572_ab42_45bd_9fd7_92448cec762a , @@ -1081,7 +1075,7 @@ NOTE 4 A measuring system can be used as a measurement standard."""@en ; emmo:EMMO_bb49844b_45d7_4f0d_8cae_8e552cbc20d6 "Measuring system"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationTask +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationTask chameo:CharacterisationTask rdf:type owl:Class ; owl:equivalentClass [ owl:intersectionOf ( emmo:EMMO_4299e344_a321_4ef2_a744_bacfcce80afc chameo:CharacterisationProcedure @@ -1099,7 +1093,7 @@ chameo:CharacterisationTask rdf:type owl:Class ; skos:prefLabel "CharacterisationTask"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationTechnique +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationTechnique chameo:CharacterisationTechnique rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_c7013b53_3071_410b_a5e4_a8d266dcdfb5 ; rdfs:comment "" ; @@ -1111,7 +1105,7 @@ chameo:CharacterisationTechnique rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "A characterisation method is not only related to the measurement process which can be one of its steps." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationWorkflow +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisationWorkflow chameo:CharacterisationWorkflow rdf:type owl:Class ; owl:equivalentClass [ owl:intersectionOf ( emmo:EMMO_64963ed6_39c9_4258_85e0_6466c4b5420c chameo:CharacterisationProcedure @@ -1129,7 +1123,7 @@ chameo:CharacterisationWorkflow rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A characterisation procedure that has at least two characterisation tasks as proper parts."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisedSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#CharacterisedSample chameo:CharacterisedSample rdf:type owl:Class ; rdfs:subClassOf chameo:Sample ; rdfs:comment "" ; @@ -1138,7 +1132,7 @@ chameo:CharacterisedSample rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The sample after having been subjected to a characterization process"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ChargeDistribution +### https://w3id.org/emmo/domain/domain-chameo/chameo#ChargeDistribution chameo:ChargeDistribution rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -1146,7 +1140,7 @@ chameo:ChargeDistribution rdf:type owl:Class ; skos:prefLabel "ChargeDistribution"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chromatography +### https://w3id.org/emmo/domain/domain-chameo/chameo#Chromatography chameo:Chromatography rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -1156,7 +1150,7 @@ chameo:Chromatography rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Chromatography" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronoamperometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Chronoamperometry chameo:Chronoamperometry rdf:type owl:Class ; rdfs:subClassOf chameo:Amperometry ; rdfs:comment "If the potential step is from a potential at which no current flows (i.e., at which the oxidation or reduction of the electrochemically active species does not take place) to one at which the current is limited by diffusion (see diffusion-limited current), the current obeys the Cottrell equation."@en , @@ -1169,7 +1163,7 @@ chameo:Chronoamperometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronocoulometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Chronocoulometry chameo:Chronocoulometry rdf:type owl:Class ; rdfs:subClassOf chameo:Coulometry ; rdfs:comment "Chronocoulometry provides the same information that is provided by chronoamperometry, since it is based on the integration of the I-t curve. Nevertheless, chronocoulometry offers important experimental advantages, such as (i) the measured signal usually increases with time and hence the later parts of the transient can be detected more accurately, (ii) a better signal-to-noise ratio can be achieved, and (iii) other contributions to overall charge passed as a function of time can be discriminated from those due to the diffusion of electroactive substances."@en , @@ -1180,7 +1174,7 @@ chameo:Chronocoulometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronopotentiometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Chronopotentiometry chameo:Chronopotentiometry rdf:type owl:Class ; rdfs:subClassOf chameo:Potentiometry ; rdfs:comment "The change in applied current is usually a step, but cyclic current reversals or linearly increasing currents are also used."@en , @@ -1191,7 +1185,7 @@ chameo:Chronopotentiometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CompressionTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#CompressionTesting chameo:CompressionTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1200,7 +1194,7 @@ chameo:CompressionTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Compression tests characterize material and product strength and stiffness under applied crushing loads. These tests are typically conducted by applying compressive pressure to a test specimen using platens or specialized fixtures with a testing machine that produces compressive loads."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ConductometricTitration +### https://w3id.org/emmo/domain/domain-chameo/chameo#ConductometricTitration chameo:ConductometricTitration rdf:type owl:Class ; rdfs:subClassOf chameo:Conductometry ; rdfs:comment "The equivalence-point is obtained as the intersection of linear parts of the conductance G, versus titrant volume V, curve (see"@en , @@ -1214,7 +1208,7 @@ chameo:ConductometricTitration rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Conductometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Conductometry chameo:Conductometry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "The conductivity of a solution depends on the concentration and nature of ions present."@en , @@ -1228,7 +1222,7 @@ chameo:Conductometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ConfocalMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ConfocalMicroscopy chameo:ConfocalMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -1237,7 +1231,7 @@ chameo:ConfocalMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a spatial pinhole to block out-of-focus light in image formation."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CoulometricTitration +### https://w3id.org/emmo/domain/domain-chameo/chameo#CoulometricTitration chameo:CoulometricTitration rdf:type owl:Class ; rdfs:subClassOf chameo:Coulometry ; rdfs:comment "Coulometric titrations are usually carried out in convective mass transfer mode using a large surface working electrode. The reference and auxiliary electrodes are located in sepa- rate compartments. A basic requirement is a 100 % current efficiency of titrant generation at the working electrode. End-point detection can be accomplished with potentiometry, amperometry, biamperometry, bipotentiometry, photometry, or by using a visual indicator."@en , @@ -1248,7 +1242,7 @@ chameo:CoulometricTitration rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "titration in which the titrant is generated electrochemically, either by constant current or at constant potential. The titrant reacts stoichiometrically with the analyte, the amount of which is calculated using Faraday’s laws of electrolysis from the electric charge required to reach the end-point"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Coulometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Coulometry chameo:Coulometry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "Coulometry used to measure the amount of substance is a primary reference measurement procedure [VIM 2.8] not requiring calibration with a standard for a quantity of the same kind (i.e. amount of substance)."@en , @@ -1263,7 +1257,7 @@ chameo:Coulometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CreepTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#CreepTesting chameo:CreepTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1272,7 +1266,7 @@ chameo:CreepTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The creep test is a destructive materials testing method for determination of the long-term strength and heat resistance of a material. When running a creep test, the specimen is subjected to increased temperature conditions for an extended period of time and loaded with a constant tensile force or tensile stress."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CriticalAndSupercriticalChromatography +### https://w3id.org/emmo/domain/domain-chameo/chameo#CriticalAndSupercriticalChromatography chameo:CriticalAndSupercriticalChromatography rdf:type owl:Class ; rdfs:subClassOf chameo:Chromatography ; rdfs:comment "" ; @@ -1280,7 +1274,7 @@ chameo:CriticalAndSupercriticalChromatography rdf:type owl:Class ; skos:prefLabel "CriticalAndSupercriticalChromatography"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CyclicChronopotentiometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#CyclicChronopotentiometry chameo:CyclicChronopotentiometry rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -1296,7 +1290,7 @@ chameo:CyclicChronopotentiometry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#CyclicVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#CyclicVoltammetry chameo:CyclicVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "Cyclic voltammetry is frequently used for the investigation of mechanisms of electrochemi- cal/electrode reactions. The current-potential curve may be modelled to obtain reaction mechanisms and electrochemical parameters."@en , @@ -1314,7 +1308,7 @@ chameo:CyclicVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DCPolarography +### https://w3id.org/emmo/domain/domain-chameo/chameo#DCPolarography chameo:DCPolarography rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "If the whole scan is performed on a single growing drop, the technique should be called single drop scan voltammetry. The term polarography in this context is discouraged."@en , @@ -1327,7 +1321,7 @@ chameo:DCPolarography rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataAcquisitionRate +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataAcquisitionRate chameo:DataAcquisitionRate rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_b7bcff25_ffc3_474e_9ab5_01b1664bd4ba ; rdfs:comment "" ; @@ -1336,7 +1330,7 @@ chameo:DataAcquisitionRate rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Quantify the raw data acquisition rate, if applicable."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataAnalysis +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataAnalysis chameo:DataAnalysis rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_1c7f2dfe_0db4_4bf6_a0f6_853054a34ead ; rdfs:comment "" ; @@ -1345,7 +1339,7 @@ chameo:DataAnalysis rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Data processing activities performed on the secondary data to determine the characterisation property (e.g. classification, quantification), which can be performed manually or exploiting a model."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataFiltering +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataFiltering chameo:DataFiltering rdf:type owl:Class ; rdfs:subClassOf chameo:DataPreparation ; rdfs:comment "" ; @@ -1354,7 +1348,7 @@ chameo:DataFiltering rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Data filtering is the process of examining a dataset to exclude, rearrange, or apportion data according to certain criteria." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataNormalisation +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataNormalisation chameo:DataNormalisation rdf:type owl:Class ; rdfs:subClassOf chameo:DataPreparation ; rdfs:comment "" ; @@ -1364,7 +1358,7 @@ chameo:DataNormalisation rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "It involves the creation of shifted and/or scaled versions of the values to allow post-processing in a way that eliminates the effects of influences on subsequent properties extraction."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataPostProcessing +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataPostProcessing chameo:DataPostProcessing rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_1c7f2dfe_0db4_4bf6_a0f6_853054a34ead ; rdfs:comment "" ; @@ -1373,7 +1367,7 @@ chameo:DataPostProcessing rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Analysis, that allows one to calculate the final material property from the calibrated primary data." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataPreparation +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataPreparation chameo:DataPreparation rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_1c7f2dfe_0db4_4bf6_a0f6_853054a34ead ; rdfs:comment "" ; @@ -1382,7 +1376,7 @@ chameo:DataPreparation rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Data preparation is the process of manipulating (or pre-processing) data (which may come from disparate data sources) to improve their quality or reduce bias in subsequent analysis." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataProcessingThroughCalibration +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataProcessingThroughCalibration chameo:DataProcessingThroughCalibration rdf:type owl:Class ; rdfs:comment "" ; rdfs:label "DataProcessingThroughCalibration"@en ; @@ -1390,7 +1384,7 @@ chameo:DataProcessingThroughCalibration rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Describes how raw data are corrected and/or modified through calibrations."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataQuality +### https://w3id.org/emmo/domain/domain-chameo/chameo#DataQuality chameo:DataQuality rdf:type owl:Class ; rdfs:comment "" ; rdfs:label "DataQuality"@en ; @@ -1399,7 +1393,7 @@ chameo:DataQuality rdf:type owl:Class ; emmo:EMMO_b432d2d5_25f4_4165_99c5_5935a7763c1a "Example evaluation of S/N ratio, or other quality indicators (limits of detection/quantification, statistical analysis of data, data robustness analysis)"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Detector +### https://w3id.org/emmo/domain/domain-chameo/chameo#Detector chameo:Detector rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardware ; rdfs:comment "" ; @@ -1410,7 +1404,7 @@ chameo:Detector rdf:type owl:Class ; "Displacement and force sensors for mechanical testing"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DielectricAndImpedanceSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#DielectricAndImpedanceSpectroscopy chameo:DielectricAndImpedanceSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -1419,7 +1413,7 @@ chameo:DielectricAndImpedanceSpectroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Dielectric spectroscopy (DS) or impedance spectroscopy, also known as electrochemical impedance spectroscopy, is frequently used to study the response of a sample subjected to an applied electric field of fixed or changing frequency. DS describes the dielectric properties of a material as a function of frequency. In DS, the radio and microwave frequency regions of the electromagnetic spectrum have been successfully made to interact with materials, so as to study the behavior of molecules. The interaction of applied alternating electric fields with dipoles possessing reorientation mobility in materials is also dealt by DS."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Dielectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Dielectrometry chameo:Dielectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "Dielectrometric titrations use dielectrometry for the end-point detection."@en , @@ -1431,7 +1425,7 @@ chameo:Dielectrometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialLinearPulseVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialLinearPulseVoltammetry chameo:DifferentialLinearPulseVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:DifferentialPulseVoltammetry ; rdfs:comment "" ; @@ -1447,7 +1441,7 @@ chameo:DifferentialLinearPulseVoltammetry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialPulseVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialPulseVoltammetry chameo:DifferentialPulseVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "Differential pulse polarography is differential pulse voltammetry in which a dropping mercury electrode is used as the working electrode. A pulse is applied before the mechani- cally enforced end of the drop and the current is sampled twice: just before the onset of the pulse and just before its end. The pulse width is usually 10 to 20 % of the drop life. The drop dislodgement is synchronized with current sampling, which is carried out as in DPV."@en , @@ -1463,7 +1457,7 @@ chameo:DifferentialPulseVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialRefractiveIndex +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialRefractiveIndex chameo:DifferentialRefractiveIndex rdf:type owl:Class ; rdfs:subClassOf chameo:OpticalTesting ; rdfs:comment "" ; @@ -1471,7 +1465,7 @@ chameo:DifferentialRefractiveIndex rdf:type owl:Class ; skos:prefLabel "DifferentialRefractiveIndex"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialScanningCalorimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialScanningCalorimetry chameo:DifferentialScanningCalorimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ThermochemicalTesting ; rdfs:comment "" ; @@ -1481,7 +1475,7 @@ chameo:DifferentialScanningCalorimetry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Differential scanning calorimetry (DSC) is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. Both the sample and reference are maintained at nearly the same temperature throughout the experiment. Generally, the temperature program for a DSC analysis is designed such that the sample holder temperature increases linearly as a function of time. The reference sample should have a well-defined heat capacity over the range of temperatures to be scanned. Additionally, the reference sample must be stable, of high purity, and must not experience much change across the temperature scan. Typically, reference standards have been metals such as indium, tin, bismuth, and lead, but other standards such as polyethylene and fatty acids have been proposed to study polymers and organic compounds, respectively."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialStaircasePulseVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialStaircasePulseVoltammetry chameo:DifferentialStaircasePulseVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:DifferentialPulseVoltammetry ; rdfs:comment "" ; @@ -1497,7 +1491,7 @@ chameo:DifferentialStaircasePulseVoltammetry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialThermalAnalysis +### https://w3id.org/emmo/domain/domain-chameo/chameo#DifferentialThermalAnalysis chameo:DifferentialThermalAnalysis rdf:type owl:Class ; rdfs:subClassOf chameo:ThermochemicalTesting ; rdfs:comment "" ; @@ -1507,7 +1501,7 @@ chameo:DifferentialThermalAnalysis rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Differential thermal analysis (DTA) is a thermoanalytic technique that is similar to differential scanning calorimetry. In DTA, the material under study and an inert reference are made to undergo identical thermal cycles, (i.e., same cooling or heating programme) while recording any temperature difference between sample and reference.[1] This differential temperature is then plotted against time, or against temperature (DTA curve, or thermogram). Changes in the sample, either exothermic or endothermic, can be detected relative to the inert reference. Thus, a DTA curve provides data on the transformations that have occurred, such as glass transitions, crystallization, melting and sublimation. The area under a DTA peak is the enthalpy change and is not affected by the heat capacity of the sample."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Dilatometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Dilatometry chameo:Dilatometry rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -1517,7 +1511,7 @@ chameo:Dilatometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Dilatometry is a method for characterising the dimensional changes of materials with variation of temperature conditions."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledCurrent +### https://w3id.org/emmo/domain/domain-chameo/chameo#DirectCoulometryAtControlledCurrent chameo:DirectCoulometryAtControlledCurrent rdf:type owl:Class ; rdfs:subClassOf chameo:Coulometry ; rdfs:comment "Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer."@en , @@ -1528,7 +1522,7 @@ chameo:DirectCoulometryAtControlledCurrent rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "coulometry at an imposed, constant current in the electrochemical cell"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledPotential +### https://w3id.org/emmo/domain/domain-chameo/chameo#DirectCoulometryAtControlledPotential chameo:DirectCoulometryAtControlledPotential rdf:type owl:Class ; rdfs:subClassOf chameo:Coulometry ; rdfs:comment "Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer."@en , @@ -1540,14 +1534,14 @@ chameo:DirectCoulometryAtControlledPotential rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCurrentInternalResistance +### https://w3id.org/emmo/domain/domain-chameo/chameo#DirectCurrentInternalResistance chameo:DirectCurrentInternalResistance rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; skos:prefLabel "DirectCurrentInternalResistance"@en ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicLightScattering +### https://w3id.org/emmo/domain/domain-chameo/chameo#DynamicLightScattering chameo:DynamicLightScattering rdf:type owl:Class ; rdfs:subClassOf chameo:OpticalTesting ; rdfs:comment "" ; @@ -1557,7 +1551,7 @@ chameo:DynamicLightScattering rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Dynamic light scattering (DLS) is a technique in physics that can be used to determine the size distribution profile of small particles in suspension or polymers in solution. In the scope of DLS, temporal fluctuations are usually analyzed using the intensity or photon auto-correlation function (also known as photon correlation spectroscopy - PCS or quasi-elastic light scattering - QELS)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalAnalysis +### https://w3id.org/emmo/domain/domain-chameo/chameo#DynamicMechanicalAnalysis chameo:DynamicMechanicalAnalysis rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1566,7 +1560,7 @@ chameo:DynamicMechanicalAnalysis rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Dynamic mechanical analysis (abbreviated DMA) is a characterisation technique where a sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature[1] of the material, as well as to identify transitions corresponding to other molecular motions."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#DynamicMechanicalSpectroscopy chameo:DynamicMechanicalSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -1576,7 +1570,7 @@ chameo:DynamicMechanicalSpectroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Dynamic Mechanical Analysis (DMA) is a material characterization technique where a small deformation is applied to a sample in a cyclic manner. This allows measurement of the materials response to stress, temperature, frequency or time. The term is also used to refer to the analyzer that performs the test."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalImpedanceSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ElectrochemicalImpedanceSpectroscopy chameo:ElectrochemicalImpedanceSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Impedimetry ; rdfs:comment "Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency."@en , @@ -1590,7 +1584,7 @@ chameo:ElectrochemicalImpedanceSpectroscopy rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalPiezoelectricMicrogravimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#ElectrochemicalPiezoelectricMicrogravimetry chameo:ElectrochemicalPiezoelectricMicrogravimetry rdf:type owl:Class ; rdfs:subClassOf chameo:Electrogravimetry ; rdfs:comment "The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made."@en , @@ -1601,7 +1595,7 @@ chameo:ElectrochemicalPiezoelectricMicrogravimetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#ElectrochemicalTesting chameo:ElectrochemicalTesting rdf:type owl:Class ; rdfs:subClassOf chameo:ChargeDistribution ; rdfs:comment "" ; @@ -1611,7 +1605,7 @@ chameo:ElectrochemicalTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Electrogravimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Electrogravimetry chameo:Electrogravimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "" ; @@ -1630,7 +1624,7 @@ chameo:Electrogravimetry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronBackscatterDiffraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#ElectronBackscatterDiffraction chameo:ElectronBackscatterDiffraction rdf:type owl:Class ; rdfs:subClassOf chameo:ScanningElectronMicroscopy , chameo:ScatteringAndDiffraction ; @@ -1641,7 +1635,7 @@ chameo:ElectronBackscatterDiffraction rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis +### https://w3id.org/emmo/domain/domain-chameo/chameo#ElectronProbeMicroanalysis chameo:ElectronProbeMicroanalysis rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -1650,7 +1644,7 @@ chameo:ElectronProbeMicroanalysis rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Ellipsometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Ellipsometry chameo:Ellipsometry rdf:type owl:Class ; rdfs:subClassOf chameo:OpticalTesting ; rdfs:comment "" ; @@ -1664,7 +1658,7 @@ layer or less. Depending on what is already known about the sample, the techniqu can probe a range of properties including layer thickness, morphology, and chemical composition."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnergyDispersiveXraySpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#EnergyDispersiveXraySpectroscopy chameo:EnergyDispersiveXraySpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; skos:altLabel "EDS"@en , @@ -1675,7 +1669,7 @@ chameo:EnergyDispersiveXraySpectroscopy rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnvironmentalScanningElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#EnvironmentalScanningElectronMicroscopy chameo:EnvironmentalScanningElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -1684,7 +1678,7 @@ chameo:EnvironmentalScanningElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Exafs +### https://w3id.org/emmo/domain/domain-chameo/chameo#Exafs chameo:Exafs rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -1694,7 +1688,7 @@ chameo:Exafs rdf:type owl:Class ; When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FatigueTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#FatigueTesting chameo:FatigueTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1703,7 +1697,7 @@ chameo:FatigueTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Fatigue testing is a specialised form of mechanical testing that is performed by applying cyclic loading to a coupon or structure. These tests are used either to generate fatigue life and crack growth data, identify critical locations or demonstrate the safety of a structure that may be susceptible to fatigue."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FibDic +### https://w3id.org/emmo/domain/domain-chameo/chameo#FibDic chameo:FibDic rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1713,7 +1707,7 @@ chameo:FibDic rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The FIB-DIC (Focused Ion Beam - Digital Image Correlation) ring-core technique is a powerful method for measuring residual stresses in materials. It is based on milling a ring-shaped sample, or core, from the material of interest using a focused ion beam (FIB)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#FieldEmissionScanningElectronMicroscopy chameo:FieldEmissionScanningElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -1723,7 +1717,7 @@ chameo:FieldEmissionScanningElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FourierTransformInfraredSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#FourierTransformInfraredSpectroscopy chameo:FourierTransformInfraredSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; skos:altLabel "FTIR"@en ; @@ -1733,7 +1727,7 @@ chameo:FourierTransformInfraredSpectroscopy rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Fourier-transform_infrared_spectroscopy"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Fractography +### https://w3id.org/emmo/domain/domain-chameo/chameo#Fractography chameo:Fractography rdf:type owl:Class ; rdfs:subClassOf chameo:OpticalTesting ; rdfs:comment "" ; @@ -1742,7 +1736,7 @@ chameo:Fractography rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture .Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#FreezingPointDepressionOsmometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#FreezingPointDepressionOsmometry chameo:FreezingPointDepressionOsmometry rdf:type owl:Class ; rdfs:subClassOf chameo:Osmometry ; rdfs:comment "" ; @@ -1751,7 +1745,7 @@ chameo:FreezingPointDepressionOsmometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The general principle of freezing point depression osmometry involves the relationship between the number of moles of dissolved solute in a solution and the change in freezing point."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GalvanostaticIntermittentTitrationTechnique +### https://w3id.org/emmo/domain/domain-chameo/chameo#GalvanostaticIntermittentTitrationTechnique chameo:GalvanostaticIntermittentTitrationTechnique rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -1762,7 +1756,7 @@ chameo:GalvanostaticIntermittentTitrationTechnique rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GammaSpectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#GammaSpectrometry chameo:GammaSpectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:Spectrometry ; rdfs:comment "" ; @@ -1775,7 +1769,7 @@ Most radioactive sources produce gamma rays, which are of various energies and i A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#GasAdsorptionPorosimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#GasAdsorptionPorosimetry chameo:GasAdsorptionPorosimetry rdf:type owl:Class ; rdfs:subClassOf chameo:Porosimetry ; rdfs:comment "" ; @@ -1785,7 +1779,7 @@ chameo:GasAdsorptionPorosimetry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Gas Adsorption Porosimetry is a method used for analyzing the surface area and porosity of materials. In this method, a gas, typically nitrogen or argon, is adsorbed onto the surface of the material at various pressures and temperatures."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HPPC +### https://w3id.org/emmo/domain/domain-chameo/chameo#HPPC chameo:HPPC rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -1796,7 +1790,7 @@ chameo:HPPC rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "electrochemical method that measures the voltage drop of a cell resulting from a square wave current load"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HardnessTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#HardnessTesting chameo:HardnessTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -1805,7 +1799,7 @@ chameo:HardnessTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A test to determine the resistance a material exhibits to permanent deformation by penetration of another harder material."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Hazard +### https://w3id.org/emmo/domain/domain-chameo/chameo#Hazard chameo:Hazard rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_b7bcff25_ffc3_474e_9ab5_01b1664bd4ba ; rdfs:comment "" ; @@ -1814,7 +1808,7 @@ chameo:Hazard rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Set of inherent properties of a substance, mixture of substances, or a process involving substances that, under production, usage, or disposal conditions, make it capable of causing adverse effects to organisms or the environment, depending on the degree of exposure; in other words, it is a source of danger."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Holder +### https://w3id.org/emmo/domain/domain-chameo/chameo#Holder chameo:Holder rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardware ; rdfs:comment "" ; @@ -1823,7 +1817,7 @@ chameo:Holder rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "An object which supports the specimen in the correct position for the characterisation process."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#HydrodynamicVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#HydrodynamicVoltammetry chameo:HydrodynamicVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied."@en , @@ -1838,7 +1832,7 @@ chameo:HydrodynamicVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ICI +### https://w3id.org/emmo/domain/domain-chameo/chameo#ICI chameo:ICI rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -1848,7 +1842,7 @@ chameo:ICI rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Impedimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Impedimetry chameo:Impedimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "" ; @@ -1858,7 +1852,7 @@ chameo:Impedimetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#InteractionVolume +### https://w3id.org/emmo/domain/domain-chameo/chameo#InteractionVolume chameo:InteractionVolume rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_90ae56e4_d197_49b6_be1a_0049e4756606 ; rdfs:comment "" ; @@ -1871,7 +1865,7 @@ chameo:InteractionVolume rdf:type owl:Class ; "It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IntermediateSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#IntermediateSample chameo:IntermediateSample rdf:type owl:Class ; rdfs:subClassOf chameo:Sample ; rdfs:comment "" ; @@ -1879,7 +1873,7 @@ chameo:IntermediateSample rdf:type owl:Class ; skos:prefLabel "IntermediateSample"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonChromatography +### https://w3id.org/emmo/domain/domain-chameo/chameo#IonChromatography chameo:IonChromatography rdf:type owl:Class ; rdfs:subClassOf chameo:Chromatography ; rdfs:comment "" ; @@ -1889,7 +1883,7 @@ chameo:IonChromatography rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Ion_chromatography" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonMobilitySpectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#IonMobilitySpectrometry chameo:IonMobilitySpectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:Spectrometry ; rdfs:comment "" ; @@ -1899,7 +1893,7 @@ chameo:IonMobilitySpectrometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Ion mobility spectrometry (IMS) It is a method of conducting analytical research that separates and identifies ionized molecules present in the gas phase based on the mobility of the molecules in a carrier buffer gas. Even though it is used extensively for military or security objectives, such as detecting drugs and explosives, the technology also has many applications in laboratory analysis, including studying small and big biomolecules. IMS instruments are extremely sensitive stand-alone devices, but are often coupled with mass spectrometry, gas chromatography or high-performance liquid chromatography in order to achieve a multi-dimensional separation. They come in various sizes, ranging from a few millimeters to several meters depending on the specific application, and are capable of operating under a broad range of conditions. IMS instruments such as microscale high-field asymmetric-waveform ion mobility spectrometry can be palm-portable for use in a range of applications including volatile organic compound (VOC) monitoring, biological sample analysis, medical diagnosis and food quality monitoring."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#IsothermalMicrocalorimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#IsothermalMicrocalorimetry chameo:IsothermalMicrocalorimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ThermochemicalTesting ; rdfs:comment "" ; @@ -1911,7 +1905,7 @@ chameo:IsothermalMicrocalorimetry rdf:type owl:Class ; IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Laboratory +### https://w3id.org/emmo/domain/domain-chameo/chameo#Laboratory chameo:Laboratory rdf:type owl:Class ; rdfs:comment "" ; rdfs:label "Laboratory" ; @@ -1919,7 +1913,7 @@ chameo:Laboratory rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The laboratory where the whole characterisation process or some of its stages take place." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfAutomation +### https://w3id.org/emmo/domain/domain-chameo/chameo#LevelOfAutomation chameo:LevelOfAutomation rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_909415d1_7c43_4d5e_bbeb_7e1910159f66 ; rdfs:comment "" ; @@ -1928,7 +1922,7 @@ chameo:LevelOfAutomation rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Describes the level of automation of the test."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfExpertise +### https://w3id.org/emmo/domain/domain-chameo/chameo#LevelOfExpertise chameo:LevelOfExpertise rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_909415d1_7c43_4d5e_bbeb_7e1910159f66 ; rdfs:comment "" ; @@ -1937,7 +1931,7 @@ chameo:LevelOfExpertise rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Describes the level of expertise required to carry out a process (the entire test or the data processing)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LightScattering +### https://w3id.org/emmo/domain/domain-chameo/chameo#LightScattering chameo:LightScattering rdf:type owl:Class ; rdfs:subClassOf chameo:OpticalTesting ; rdfs:comment "" ; @@ -1946,7 +1940,7 @@ chameo:LightScattering rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Light scattering is the way light behaves when it interacts with a medium that contains particles or the boundary between different mediums where defects or structures are present. It is different than the effects of refraction, where light undergoes a change in index of refraction as it passes from one medium to another, or reflection, where light reflects back into the same medium, both of which are governed by Snell’s law. Light scattering can be caused by factors such as the nature, texture, or specific structures of a surface and the presence of gas, liquid, or solid particles through which light propagates, as well as the nature of the light itself, of its wavelengths and polarization states. It usually results in diffuse light and can also affect the dispersion of color."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearChronopotentiometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#LinearChronopotentiometry chameo:LinearChronopotentiometry rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -1962,7 +1956,7 @@ chameo:LinearChronopotentiometry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearScanVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#LinearScanVoltammetry chameo:LinearScanVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "LSV corresponds to the first half cycle of cyclic voltammetry."@en , @@ -1980,7 +1974,7 @@ chameo:LinearScanVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MassSpectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#MassSpectrometry chameo:MassSpectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:Spectrometry ; rdfs:comment "" ; @@ -1989,7 +1983,7 @@ chameo:MassSpectrometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Mass spectrometry is a powerful analytical technique used to quantify known materials, to identify unknown compounds within a sample, and to elucidate the structure and chemical properties of different molecules."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementDataPostProcessing +### https://w3id.org/emmo/domain/domain-chameo/chameo#MeasurementDataPostProcessing chameo:MeasurementDataPostProcessing rdf:type owl:Class ; rdfs:subClassOf chameo:DataPostProcessing ; rdfs:comment "" ; @@ -2000,7 +1994,7 @@ chameo:MeasurementDataPostProcessing rdf:type owl:Class ; "In nanoindentation testing, this is the Oliver-Pharr method, which allows calculating the elastic modulus and hardness of the sample by using the load and depth measured signals."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#MeasurementParameter chameo:MeasurementParameter rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_d1d436e7_72fc_49cd_863b_7bfb4ba5276a ; rdfs:comment "" ; @@ -2009,7 +2003,7 @@ chameo:MeasurementParameter rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Describes the main input parameters that are needed to acquire the signal"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementSystemAdjustment +### https://w3id.org/emmo/domain/domain-chameo/chameo#MeasurementSystemAdjustment chameo:MeasurementSystemAdjustment rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure ; rdfs:comment "" ; @@ -2030,7 +2024,7 @@ The output of this process can be a specific measurement parameter to be used in emmo:EMMO_bb49844b_45d7_4f0d_8cae_8e552cbc20d6 "Adjustment"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementTime +### https://w3id.org/emmo/domain/domain-chameo/chameo#MeasurementTime chameo:MeasurementTime rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_b7bcff25_ffc3_474e_9ab5_01b1664bd4ba ; rdfs:comment "" ; @@ -2039,7 +2033,7 @@ chameo:MeasurementTime rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The overall time needed to acquire the measurement data"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MechanicalTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#MechanicalTesting chameo:MechanicalTesting rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2051,7 +2045,7 @@ chameo:MechanicalTesting rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Mechanical_testing" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MembraneOsmometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#MembraneOsmometry chameo:MembraneOsmometry rdf:type owl:Class ; rdfs:subClassOf chameo:Osmometry ; rdfs:comment "" ; @@ -2060,7 +2054,7 @@ chameo:MembraneOsmometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#MercuryPorosimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#MercuryPorosimetry chameo:MercuryPorosimetry rdf:type owl:Class ; rdfs:subClassOf chameo:Porosimetry ; rdfs:comment "" ; @@ -2069,7 +2063,7 @@ chameo:MercuryPorosimetry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "a method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Microscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#Microscopy chameo:Microscopy rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2078,7 +2072,7 @@ chameo:Microscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nanoindentation +### https://w3id.org/emmo/domain/domain-chameo/chameo#Nanoindentation chameo:Nanoindentation rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -2088,7 +2082,7 @@ chameo:Nanoindentation rdf:type owl:Class ; emmo:EMMO_b432d2d5_25f4_4165_99c5_5935a7763c1a "By definition, when someone performs nanoindentation, it refers to either quasistatic or continuous stiffness measurement. However, in reality with a nanoindenter it is also possible to perform scratch testing, scanning probe microscopy, and apply non-contact surface energy mapping, which can also be called nanoindentation, because they are measurements conducted using an nanoindenter."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NeutronSpinEchoSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#NeutronSpinEchoSpectroscopy chameo:NeutronSpinEchoSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -2098,7 +2092,7 @@ chameo:NeutronSpinEchoSpectroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Neutron spin echo spectroscopy is a high resolution inelastic neutron scattering method probing nanosecond dynamics. Neutron spin echo (NSE) spectroscopy uses the precession of neutron spins in a magnetic field to measure the energy transfer at the sample and decouples the energy resolution from beam characteristics like monochromatisation and collimation."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nexafs +### https://w3id.org/emmo/domain/domain-chameo/chameo#Nexafs chameo:Nexafs rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -2107,7 +2101,7 @@ chameo:Nexafs rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Near edge X-ray absorption fine structure (NEXAFS), also known as X-ray absorption near edge structure (XANES), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NormalPulseVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#NormalPulseVoltammetry chameo:NormalPulseVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV."@en , @@ -2123,7 +2117,7 @@ chameo:NormalPulseVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#NuclearMagneticResonance +### https://w3id.org/emmo/domain/domain-chameo/chameo#NuclearMagneticResonance chameo:NuclearMagneticResonance rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -2134,7 +2128,7 @@ chameo:NuclearMagneticResonance rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Nuclear magnetic resonance spectroscopy, most commonly known as NMR spectroscopy or magnetic resonance spectroscopy (MRS), is a spectroscopic technique to observe local magnetic fields around atomic nuclei. This spectroscopy is based on the measurement of absorption of electromagnetic radiations in the radio frequency region from roughly 4 to 900 MHz. Absorption of radio waves in the presence of magnetic field is accompanied by a special type of nuclear transition, and for this reason, such type of spectroscopy is known as Nuclear Magnetic Resonance Spectroscopy. The sample is placed in a magnetic field and the NMR signal is produced by excitation of the nuclei sample with radio waves into nuclear magnetic resonance, which is detected with sensitive radio receivers. The intramolecular magnetic field around an atom in a molecule changes the resonance frequency, thus giving access to details of the electronic structure of a molecule and its individual functional groups. As the fields are unique or highly characteristic to individual compounds, in modern organic chemistry practice, NMR spectroscopy is the definitive method to identify monomolecular organic compounds."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpenCircuitHold +### https://w3id.org/emmo/domain/domain-chameo/chameo#OpenCircuitHold chameo:OpenCircuitHold rdf:type owl:Class ; rdfs:subClassOf chameo:Potentiometry ; rdfs:comment "" ; @@ -2144,7 +2138,7 @@ chameo:OpenCircuitHold rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "a process in which the electric current is kept constant at 0 (i.e., open-circuit conditions)"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Operator +### https://w3id.org/emmo/domain/domain-chameo/chameo#Operator chameo:Operator rdf:type owl:Class ; rdfs:subClassOf [ owl:intersectionOf ( foaf:Person emmo:EMMO_c130614a_2985_476d_a7ed_8a137847703c @@ -2157,7 +2151,7 @@ chameo:Operator rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The human operator who takes care of the whole characterisation method or sub-processes/stages."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#OpticalMicroscopy chameo:OpticalMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2166,7 +2160,7 @@ chameo:OpticalMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#OpticalTesting chameo:OpticalTesting rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2174,7 +2168,7 @@ chameo:OpticalTesting rdf:type owl:Class ; skos:prefLabel "OpticalTesting"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Osmometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Osmometry chameo:Osmometry rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2183,7 +2177,7 @@ chameo:Osmometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Osmometry is an advanced analytical method for determining the osmotic concentration of solutions. The osmotic – or solute – concentration of a colloidal system is expressed in osmoles (Osm) per unit of volume (Osm/L) or weight (Osm/kg)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PhotoluminescenceMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#PhotoluminescenceMicroscopy chameo:PhotoluminescenceMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2192,7 +2186,7 @@ chameo:PhotoluminescenceMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Photoluminescence spectroscopy is a widely used technique for characterisation of the optical and electronic properties of semiconductors and molecules."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PhysicsOfInteraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#PhysicsOfInteraction chameo:PhysicsOfInteraction rdf:type owl:Class ; rdfs:subClassOf [ rdf:type owl:Class ; owl:unionOf ( emmo:EMMO_27c5d8c6_8af7_4d63_beb1_ec37cd8b3fa3 @@ -2206,11 +2200,11 @@ chameo:PhysicsOfInteraction rdf:type owl:Class ; emmo:EMMO_b432d2d5_25f4_4165_99c5_5935a7763c1a "In x-ray diffraction, this is represented by the set of physics equations that describe the relation between the incident x-ray beam and the diffracted beam (the most simple form for this being the Bragg’s law)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Porosimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Porosimetry chameo:Porosimetry rdf:type owl:Class . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PostProcessingModel +### https://w3id.org/emmo/domain/domain-chameo/chameo#PostProcessingModel chameo:PostProcessingModel rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_f7ed665b_c2e1_42bc_889b_6b42ed3a36f0 ; rdfs:comment "" ; @@ -2220,7 +2214,7 @@ chameo:PostProcessingModel rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "The PostProcessingModel use is mainly intended to get secondary data from primary data."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PotentiometricStrippingAnalysis +### https://w3id.org/emmo/domain/domain-chameo/chameo#PotentiometricStrippingAnalysis chameo:PotentiometricStrippingAnalysis rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury"@en , @@ -2269,7 +2263,7 @@ chameo:PotentiometricStrippingAnalysis rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Potentiometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Potentiometry chameo:Potentiometry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "For measurements using ion-selective electrodes, the measurement is made under equi- librium conditions what means that the macroscopic electric current is zero and the con- centrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selec- tive electrode."@en , @@ -2283,7 +2277,7 @@ chameo:Potentiometry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PreparedSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#PreparedSample chameo:PreparedSample rdf:type owl:Class ; rdfs:subClassOf chameo:Sample ; owl:disjointWith chameo:ReferenceSample ; @@ -2293,7 +2287,7 @@ chameo:PreparedSample rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The sample after a preparation process."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PrimaryData +### https://w3id.org/emmo/domain/domain-chameo/chameo#PrimaryData chameo:PrimaryData rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationData ; rdfs:comment "" ; @@ -2305,7 +2299,7 @@ chameo:PrimaryData rdf:type owl:Class ; "X and Y axes correction"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Probe +### https://w3id.org/emmo/domain/domain-chameo/chameo#Probe chameo:Probe rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardware ; rdfs:comment "" ; @@ -2319,7 +2313,7 @@ chameo:Probe rdf:type owl:Class ; "In x-ray diffraction, the probe is a beam of x-rays with known energy that is properly focused on the sample’s surface with a well-defined geometry"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ProbeSampleInteraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#ProbeSampleInteraction chameo:ProbeSampleInteraction rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_43e9a05d_98af_41b4_92f6_00f79a09bfce , [ rdf:type owl:Restriction ; @@ -2332,7 +2326,7 @@ chameo:ProbeSampleInteraction rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Process representing the interaction between the Probe and the Sample (with a certain Interaction Volume) which generates a Signal"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ProcessingReproducibility +### https://w3id.org/emmo/domain/domain-chameo/chameo#ProcessingReproducibility chameo:ProcessingReproducibility rdf:type owl:Class ; rdfs:comment "" ; rdfs:label "ProcessingReproducibility"@en ; @@ -2340,7 +2334,7 @@ chameo:ProcessingReproducibility rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Description of performed statistical analysis to check for data reproducibility (e.g. easily reproducible for everyone, reproducible for a domain expert, reproducible only for Data processing Expert)"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Profilometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Profilometry chameo:Profilometry rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2349,7 +2343,7 @@ chameo:Profilometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Profilometry is a technique used to extract topographical data from a surface. This can be a single point, a line scan or even a full three dimensional scan. The purpose of profilometry is to get surface morphology, step heights and surface roughness."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PseudoOpenCircuitVoltageMethod +### https://w3id.org/emmo/domain/domain-chameo/chameo#PseudoOpenCircuitVoltageMethod chameo:PseudoOpenCircuitVoltageMethod rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:label "PseudoOpenCircuitVoltageMethod"@en ; @@ -2358,7 +2352,7 @@ chameo:PseudoOpenCircuitVoltageMethod rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "a technique used to measure the voltage of a cell under a low applied current as an estimate for the open-circuit voltage"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#PulsedElectroacousticMethod +### https://w3id.org/emmo/domain/domain-chameo/chameo#PulsedElectroacousticMethod chameo:PulsedElectroacousticMethod rdf:type owl:Class ; rdfs:subClassOf chameo:ChargeDistribution ; rdfs:comment "" ; @@ -2368,7 +2362,7 @@ chameo:PulsedElectroacousticMethod rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1007/s10832-023-00332-y" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#RamanSpectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#RamanSpectroscopy chameo:RamanSpectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -2381,7 +2375,14 @@ Raman spectroscopy relies upon inelastic scattering of photons, known as Raman s Typically, a sample is illuminated with a laser beam. Electromagnetic radiation from the illuminated spot is collected with a lens and sent through a monochromator. Elastic scattered radiation at the wavelength corresponding to the laser line (Rayleigh scattering) is filtered out by either a notch filter, edge pass filter, or a band pass filter, while the rest of the collected light is dispersed onto a detector."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#RawData +### https://w3id.org/emmo/domain/domain-chameo/chameo#Rationale +chameo:Rationale rdf:type owl:Class ; + rdfs:subClassOf emmo:EMMO_50ea1ec5_f157_41b0_b46b_a9032f17ca10 ; + skos:prefLabel "Rationale" ; + emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "A set of reasons or a logical basis for a decision or belief" . + + +### https://w3id.org/emmo/domain/domain-chameo/chameo#RawData chameo:RawData rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_0f6f0120_c079_4d95_bb11_4ddee05e530e , chameo:CharacterisationData ; @@ -2395,7 +2396,7 @@ chameo:RawData rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "In some cases, raw data can be considered to have already some level of data processing, e.g., in electron microscopy a “raw image” that is formed on the screen is already result from multiple processing after the signal is acquired by the detector."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#RawSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#RawSample chameo:RawSample rdf:type owl:Class ; rdfs:subClassOf chameo:Sample ; rdfs:comment "" ; @@ -2403,7 +2404,7 @@ chameo:RawSample rdf:type owl:Class ; skos:prefLabel "RawSample"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ReferenceSample +### https://w3id.org/emmo/domain/domain-chameo/chameo#ReferenceSample chameo:ReferenceSample rdf:type owl:Class ; rdfs:subClassOf chameo:Sample ; rdfs:comment "" ; @@ -2434,7 +2435,7 @@ materials – Selected terms and definitions, definition 2.1.1) for both measure emmo:EMMO_bb49844b_45d7_4f0d_8cae_8e552cbc20d6 "Reference material"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Sample +### https://w3id.org/emmo/domain/domain-chameo/chameo#Sample chameo:Sample rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_90ae56e4_d197_49b6_be1a_0049e4756606 ; rdfs:comment "" ; @@ -2445,7 +2446,7 @@ chameo:Sample rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "Sample and Specime are often used interchangeably. However in some cases the term Specimen is used to specify a portion taken under conditions such that the sampling variability cannot be assessed (usually because the population is changing), and is assumed, for convenience, to be zero." . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspection +### https://w3id.org/emmo/domain/domain-chameo/chameo#SampleInspection chameo:SampleInspection rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure ; rdfs:comment "" ; @@ -2455,7 +2456,7 @@ chameo:SampleInspection rdf:type owl:Class ; emmo:EMMO_b432d2d5_25f4_4165_99c5_5935a7763c1a "In the Nanoindentation method the Scanning Electron Microscope to determine the indentation area."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspectionInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#SampleInspectionInstrument chameo:SampleInspectionInstrument rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardware ; rdfs:comment "" ; @@ -2463,7 +2464,7 @@ chameo:SampleInspectionInstrument rdf:type owl:Class ; skos:prefLabel "SampleInspectionInstrument" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspectionParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#SampleInspectionParameter chameo:SampleInspectionParameter rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_d1d436e7_72fc_49cd_863b_7bfb4ba5276a ; rdfs:label "SampleInspectionParameter"@en ; @@ -2471,7 +2472,7 @@ chameo:SampleInspectionParameter rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Parameter used for the sample inspection process"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparation +### https://w3id.org/emmo/domain/domain-chameo/chameo#SamplePreparation chameo:SamplePreparation rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure , [ rdf:type owl:Restriction ; @@ -2492,16 +2493,7 @@ chameo:SamplePreparation rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Sample preparation processes (e.g., machining, polishing, cutting to size, etc.) before actual observation and measurement."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationHardware -chameo:SamplePreparationHardware rdf:type owl:Class ; - rdfs:subClassOf emmo:EMMO_86ca9b93_1183_4b65_81b8_c0fcd3bba5ad ; - rdfs:comment "" ; - rdfs:label "SamplePreparationHardware"@en ; - skos:prefLabel "SamplePreparationHardware"@en ; - emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Hardware used for the preparation of the sample."@en . - - -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationInstrument +### https://w3id.org/emmo/domain/domain-chameo/chameo#SamplePreparationInstrument chameo:SamplePreparationInstrument rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationHardware ; rdfs:comment "" ; @@ -2509,7 +2501,7 @@ chameo:SamplePreparationInstrument rdf:type owl:Class ; skos:prefLabel "SamplePreparationInstrument" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationParameter +### https://w3id.org/emmo/domain/domain-chameo/chameo#SamplePreparationParameter chameo:SamplePreparationParameter rdf:type owl:Class ; rdfs:subClassOf emmo:EMMO_d1d436e7_72fc_49cd_863b_7bfb4ba5276a ; rdfs:comment "" ; @@ -2518,7 +2510,7 @@ chameo:SamplePreparationParameter rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Parameter used for the sample preparation process"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampledDCPolarography +### https://w3id.org/emmo/domain/domain-chameo/chameo#SampledDCPolarography chameo:SampledDCPolarography rdf:type owl:Class ; rdfs:subClassOf chameo:DCPolarography ; rdfs:comment "In this way, the ratio of faradaic current to double layer charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detection is lowered."@en , @@ -2530,7 +2522,7 @@ chameo:SampledDCPolarography rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplingProcess +### https://w3id.org/emmo/domain/domain-chameo/chameo#SamplingProcess chameo:SamplingProcess rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationProcedure ; rdfs:comment "" ; @@ -2540,7 +2532,7 @@ chameo:SamplingProcess rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "The term can be used to cover either a unit of supply or a portion for analysis. The portion taken may consist of one or more sub-samples and the batch may be the population from which the sample is taken."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScanningAugerElectronMicroscopy chameo:ScanningAugerElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2550,7 +2542,7 @@ chameo:ScanningAugerElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScanningElectronMicroscopy chameo:ScanningElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2560,7 +2552,7 @@ chameo:ScanningElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScanningKelvinProbe chameo:ScanningKelvinProbe rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2570,7 +2562,7 @@ chameo:ScanningKelvinProbe rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningProbeMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScanningProbeMicroscopy chameo:ScanningProbeMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2579,7 +2571,7 @@ chameo:ScanningProbeMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningTunnelingMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScanningTunnelingMicroscopy chameo:ScanningTunnelingMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2589,7 +2581,7 @@ chameo:ScanningTunnelingMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Scanning Tunneling Microscopy, or STM, is an imaging technique used to obtain ultra-high resolution images at the atomic scale, without using light or electron beams."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScatteringAndDiffraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#ScatteringAndDiffraction chameo:ScatteringAndDiffraction rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2597,7 +2589,7 @@ chameo:ScatteringAndDiffraction rdf:type owl:Class ; skos:prefLabel "ScatteringAndDiffraction"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryData +### https://w3id.org/emmo/domain/domain-chameo/chameo#SecondaryData chameo:SecondaryData rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationData ; rdfs:comment "" ; @@ -2609,7 +2601,7 @@ chameo:SecondaryData rdf:type owl:Class ; "Intensity maps"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#SecondaryIonMassSpectrometry chameo:SecondaryIonMassSpectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:Spectrometry ; rdfs:comment "" ; @@ -2619,7 +2611,7 @@ chameo:SecondaryIonMassSpectrometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ShearOrTorsionTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#ShearOrTorsionTesting chameo:ShearOrTorsionTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -2627,7 +2619,7 @@ chameo:ShearOrTorsionTesting rdf:type owl:Class ; skos:prefLabel "ShearOrTorsionTesting"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Signal +### https://w3id.org/emmo/domain/domain-chameo/chameo#Signal chameo:Signal rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationData ; rdfs:comment "" ; @@ -2638,7 +2630,7 @@ chameo:Signal rdf:type owl:Class ; emmo:EMMO_c7b62dd7_063a_4c2a_8504_42f7264ba83f "Signal is usually emitted from a characteristic “emission” volume, which can be different from the sample/probe “interaction” volume and can be usually quantified using proper physics equations and/or modelling of the interaction mechanisms."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Spectrometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Spectrometry chameo:Spectrometry rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2647,7 +2639,7 @@ chameo:Spectrometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Spectroscopic techniques are numerous and varied, but all involve measuring the response of a material to different frequencies of electromagnetic radiation. Depending on the technique used, material characterization may be based on the absorption, emission, impedance, or reflection of incident energy by a sample."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Spectroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#Spectroscopy chameo:Spectroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2656,7 +2648,7 @@ chameo:Spectroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Spectroscopy is a category of characterization techniques which use a range of principles to reveal the chemical composition, composition variation, crystal structure and photoelectric properties of materials."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#SquareWaveVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#SquareWaveVoltammetry chameo:SquareWaveVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "Most instruments show plots of the current at the end of the forward-going pulse and of the backward-going pulse vs. the potential, as well as their difference. This can give valuable information on the kinetics of the electrode reaction and the electrode process."@en , @@ -2674,7 +2666,7 @@ chameo:SquareWaveVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#StepChronopotentiometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#StepChronopotentiometry chameo:StepChronopotentiometry rdf:type owl:Class ; rdfs:subClassOf chameo:Chronopotentiometry ; rdfs:comment "" ; @@ -2690,7 +2682,7 @@ chameo:StepChronopotentiometry rdf:type owl:Class ; ] . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#StrippingVoltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#StrippingVoltammetry chameo:StrippingVoltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:Voltammetry ; rdfs:comment "Anodic stripping voltammetry (ASV) was historically used to measure concentrations of metal ions in solution using cathodic accumulation with mercury to form an amalgam. Due to the toxicity of mercury and its compounds, inductively coupled plasma optical emission spectrometry and inductively coupled plasma mass spectrometry have frequently replaced ASV at mercury electrodes in the laboratory, often sacrificing the probing of speciation and lability in complex matrices. Mercury has now been replaced by non-toxic bismuth or anti- mony as films on a solid electrode support (such as glassy carbon) with equally good sensi- tivity and detection limits."@en , @@ -2706,7 +2698,7 @@ chameo:StrippingVoltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Synchrotron +### https://w3id.org/emmo/domain/domain-chameo/chameo#Synchrotron chameo:Synchrotron rdf:type owl:Class ; rdfs:subClassOf chameo:ScatteringAndDiffraction ; rdfs:comment "" ; @@ -2714,7 +2706,7 @@ chameo:Synchrotron rdf:type owl:Class ; skos:prefLabel "Synchrotron"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#TensileTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#TensileTesting chameo:TensileTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -2724,7 +2716,7 @@ chameo:TensileTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Tensile testing, also known as tension testing, is a test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength, breaking strength, maximum elongation and reduction in area. From these measurements the following properties can also be determined: Young's modulus, Poisson's ratio, yield strength, and strain-hardening characteristics. Uniaxial tensile testing is the most commonly used for obtaining the mechanical characteristics of isotropic materials. Some materials use biaxial tensile testing. The main difference between these testing machines being how load is applied on the materials."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ThermochemicalTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#ThermochemicalTesting chameo:ThermochemicalTesting rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2734,7 +2726,7 @@ chameo:ThermochemicalTesting rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Thermomechanical analysis (TMA) is a technique used in thermal analysis, a branch of materials science which studies the properties of materials as they change with temperature."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Thermogravimetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Thermogravimetry chameo:Thermogravimetry rdf:type owl:Class ; rdfs:subClassOf chameo:ThermochemicalTesting ; rdfs:comment "" ; @@ -2744,7 +2736,7 @@ chameo:Thermogravimetry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Thermogravimetric analysis or thermal gravimetric analysis (TGA) is a method of thermal analysis in which the mass of a sample is measured over time as the temperature changes. This measurement provides information about physical phenomena, such as phase transitions, absorption, adsorption and desorption; as well as chemical phenomena including chemisorptions, thermal decomposition, and solid-gas reactions (e.g., oxidation or reduction)."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#ThreePointBendingTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#ThreePointBendingTesting chameo:ThreePointBendingTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; skos:altLabel "ThreePointFlexuralTest"@en ; @@ -2754,7 +2746,7 @@ chameo:ThreePointBendingTesting rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Three-point_flexural_test"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Tomography +### https://w3id.org/emmo/domain/domain-chameo/chameo#Tomography chameo:Tomography rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2763,7 +2755,7 @@ chameo:Tomography rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Tomography is imaging by sections or sectioning that uses any kind of penetrating wave. The method is used in radiology, archaeology, biology, atmospheric science, geophysics, oceanography, plasma physics, materials science, cosmochemistry, astrophysics, quantum information, and other areas of science. The word tomography is derived from Ancient Greek τόμος tomos, \"slice, section\" and γράφω graphō, \"to write\" or, in this context as well, \"to describe.\" A device used in tomography is called a tomograph, while the image produced is a tomogram."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#TransmissionElectronMicroscopy +### https://w3id.org/emmo/domain/domain-chameo/chameo#TransmissionElectronMicroscopy chameo:TransmissionElectronMicroscopy rdf:type owl:Class ; rdfs:subClassOf chameo:Microscopy ; rdfs:comment "" ; @@ -2773,7 +2765,7 @@ chameo:TransmissionElectronMicroscopy rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#UltrasonicTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#UltrasonicTesting chameo:UltrasonicTesting rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2784,13 +2776,14 @@ chameo:UltrasonicTesting rdf:type owl:Class ; Ultrasonic testing is often performed on steel and other metals and alloys, though it can also be used on concrete, wood and composites, albeit with less resolution. It is used in many industries including steel and aluminium construction, metallurgy, manufacturing, aerospace, automotive and other transportation sectors."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#UserCase +### https://w3id.org/emmo/domain/domain-chameo/chameo#UserCase chameo:UserCase rdf:type owl:Class ; + rdfs:subClassOf emmo:EMMO_50ea1ec5_f157_41b0_b46b_a9032f17ca10 ; skos:prefLabel "UserCase" ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "High level description of the user case. It can include the properties of the material, the conditions of the environment and possibly mentioning which are the industrial sectors of reference."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#VaporPressureDepressionOsmometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#VaporPressureDepressionOsmometry chameo:VaporPressureDepressionOsmometry rdf:type owl:Class ; rdfs:subClassOf chameo:Osmometry ; rdfs:comment "" ; @@ -2800,7 +2793,7 @@ chameo:VaporPressureDepressionOsmometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Vapor pressure osmometry measures vapor pressure indirectly by measuring the change in temperature of a polymer solution on dilution by solvent vapor and is generally useful for polymers with Mn below 10,000–40,000 g/mol. When molecular weight is more than that limit, the quantity being measured becomes very small to detect."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Viscometry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Viscometry chameo:Viscometry rdf:type owl:Class ; rdfs:subClassOf chameo:CharacterisationTechnique ; rdfs:comment "" ; @@ -2810,7 +2803,7 @@ chameo:Viscometry rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "Viscometry or viscosity method was one of the first methods used for determining the MW of polymers. In this method, the viscosity of polymer solution is measured, and the simplest method used is capillary viscometry by using the Ubbelohde U-tube viscometer. In this method, both the flow time of the polymer solution (t) and the flow time of the pure solvent (t0) are recorded. The ratio of the polymer solution flow time (t) to the flow time of pure solvent (t0) is equal to the ratio of their viscosities (η/η0) only if they have the same densities."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#Voltammetry +### https://w3id.org/emmo/domain/domain-chameo/chameo#Voltammetry chameo:Voltammetry rdf:type owl:Class ; rdfs:subClassOf chameo:ElectrochemicalTesting ; rdfs:comment "The current vs. potential (I-E) curve is called a voltammogram."@en , @@ -2824,7 +2817,7 @@ chameo:Voltammetry rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#VoltammetryAtARotatingDiskElectrode +### https://w3id.org/emmo/domain/domain-chameo/chameo#VoltammetryAtARotatingDiskElectrode chameo:VoltammetryAtARotatingDiskElectrode rdf:type owl:Class ; rdfs:subClassOf chameo:HydrodynamicVoltammetry ; rdfs:comment "" ; @@ -2834,7 +2827,7 @@ chameo:VoltammetryAtARotatingDiskElectrode rdf:type owl:Class ; emmo:EMMO_fe015383_afb3_44a6_ae86_043628697aa2 "https://doi.org/10.1515/pac-2018-0109"@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#WearTesting +### https://w3id.org/emmo/domain/domain-chameo/chameo#WearTesting chameo:WearTesting rdf:type owl:Class ; rdfs:subClassOf chameo:MechanicalTesting ; rdfs:comment "" ; @@ -2844,7 +2837,7 @@ chameo:WearTesting rdf:type owl:Class ; Wear is defined as the progressive removal of the material from a solid surface and manifested by a change in the geometry of the surface."""@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#XpsVariableKinetic +### https://w3id.org/emmo/domain/domain-chameo/chameo#XpsVariableKinetic chameo:XpsVariableKinetic rdf:type owl:Class ; rdfs:subClassOf chameo:Spectroscopy ; rdfs:comment "" ; @@ -2855,7 +2848,7 @@ chameo:XpsVariableKinetic rdf:type owl:Class ; emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "X-ray photoelectron spectroscopy (XPS), also known as ESCA (electron spectroscopy for chemical analysis) is a surface analysis technique which provides both elemental and chemical state information virtually without restriction on the type of material which can be analysed. It is a relatively simple technique where the sample is illuminated with X-rays which have enough energy to eject an electron from the atom. These ejected electrons are known as photoelectrons. The kinetic energy of these emitted electrons is characteristic of the element from which the photoelectron originated. The position and intensity of the peaks in an energy spectrum provide the desired chemical state and quantitative information. The surface sensitivity of XPS is determined by the distance that that photoelectron can travel through the material without losing any kinteic energy. These elastiaclly scattered photoelectrons contribute to the photoelectron peak, whilst photoelectrons that have been inelastically scattered, losing some kinetic energy before leaving the material, will contribute to the spectral background."@en . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrayDiffraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#XrayDiffraction chameo:XrayDiffraction rdf:type owl:Class ; rdfs:subClassOf chameo:ScatteringAndDiffraction ; rdfs:label "XrayDiffraction"@en ; @@ -2866,7 +2859,7 @@ chameo:XrayDiffraction rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/X-ray_crystallography" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrayPowderDiffraction +### https://w3id.org/emmo/domain/domain-chameo/chameo#XrayPowderDiffraction chameo:XrayPowderDiffraction rdf:type owl:Class ; rdfs:subClassOf chameo:XrayDiffraction ; rdfs:label "XrayPowderDiffraction"@en ; @@ -2876,7 +2869,7 @@ chameo:XrayPowderDiffraction rdf:type owl:Class ; emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Powder_diffraction" . -### https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrdGrazingIncidence +### https://w3id.org/emmo/domain/domain-chameo/chameo#XrdGrazingIncidence chameo:XrdGrazingIncidence rdf:type owl:Class ; rdfs:subClassOf chameo:ScatteringAndDiffraction ; rdfs:comment "" ;