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Source code for Yik, W., Serafini, L., Lindsey, T., Montañez, G. (2022). Identifying Bias in Data Using Two-Distribution Hypothesis Tests. AAAI/ACM Conference on Artificial Intelligence, Ethics, and Society. https://doi.org/10.1145/3514094.3534169

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Identifying Bias in Data Using Two-Distribution Hypothesis Tests

Source code for

Yik, W., Serafini, L., Lindsey, T., Montañez, G. (2022). Identifying Bias in Data Using Two-Distribution Hypothesis Tests. AAAI/ACM Conference on Artificial Intelligence, Ethics, and Society. https://doi.org/10.1145/3514094.3534169

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William Yik: wyik@hmc.edu

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Source code for Yik, W., Serafini, L., Lindsey, T., Montañez, G. (2022). Identifying Bias in Data Using Two-Distribution Hypothesis Tests. AAAI/ACM Conference on Artificial Intelligence, Ethics, and Society. https://doi.org/10.1145/3514094.3534169

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