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add eln for scienta txt test
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lukaspie committed Mar 26, 2024
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title: Cu-HTTP
definition:
value: NXmpes
version: "1.0"
method: XPS
start_time: 2022-04-08T11:47:02.0200Z
experiment_institution: Helmholtz-Zentrum Berlin
experiment_facility: BESSY II
experiment_laboratory: XPS beamline
user:
name: Alexei Nefedov
email: alexei.nefedov@kit.edu
affiliation: Karlsruhe Institute of Technology (KIT), Institut für Funktionelle Grenzflächen
address: KIT
orcid: 0000-0001-9361-8333
instrument:
energy_resolution:
type: calibrated
resolution:
value: 0.1
unit: eV
source_xray:
type: Synchrotron X-ray Source
name: BESSY II
probe: x-ray
device_information:
vendor: Helmholtz-Zentrum Berlin
model: BESSY II
identifier: null
current:
value: 298
unit: mA
beam_xray:
distance:
unit: mm
value: 0.0
#current:
#value: 30
#unit: "pA"
analyser:
name: Hemispherical Analyser dummy
description: hemispherical
device_information:
vendor: Scienta Omicron
model: null
identifier: null
collectioncolumn:
device_information:
vendor: Scienta Omicron
model: null
identifier: null
scheme: angular dispersive
energydispersion:
device_information:
vendor: Scienta Omicron
model: null
identifier: null
scheme: hemispherical
pass_energy:
unit: eV
APERTURE[entrance_slit]:
description: Analyser slit Nr. 3
shape: curved slit
size:
value: 0.4
unit: mm
detector:
amplifier_type: channeltron
detector_type: Multi-anode
manipulator:
POSITIONER[positioner_x]:
value:
value: 15.5
unit: cm
POSITIONER[positioner_y]:
value:
value: 11
unit: cm
POSITIONER[positioner_z]:
value:
value: 36
unit: cm
POSITIONER[positioner_phi]:
value:
value: 45
unit: degree
sample:
chemical_formula: Au
description: Au foil on standard sample holder
situation: vacuum
sample_history:
sample_preparation:
start_time: 2022-04-08T11:25:00.200Z
end_time: 2022-04-08T11:45:00.200Z
description: sputter cleaned with Ar ions for 20 min
method: Ar sputtering
PHYSICAL_PROCESS[sample_loading]:
start_time: 2023-03-08T10:49:12+01:00
end_time: 2023-03-08T10:52:47+01:00
description: loaded in the endstation and transferred to analysis chamber
method: vacuum transfer

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