GitHub - Harmanveer2546/Wafer-Fault-Detection: The goal is to eliminate manual work in identifying faulty wafers. Opening and handling suspected wafers disrupts the entire process. False negatives result in wasted time, manpower, and costs.

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The goal is to eliminate manual work in identifying faulty wafers. Opening and handling suspected wafers disrupts the entire process. False negatives result in wasted time, manpower, and costs.

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The goal is to eliminate manual work in identifying faulty wafers. Opening and handling suspected wafers disrupts the entire process. False negatives result in wasted time, manpower, and costs.