removed DC test structures, removed MM test structures, fixed errors #62
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test MM loss of SiN in conjunction with the SM PCM.
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Regarding space:
There are 6 files now, if the FaML and FAVE ring8001100 made it onto the chip that would be great, the rest are bracketing.
My fault for not submitting before yesterday.
I removed the DC test structures.
I removed the MM test structures.
errors
I think the multi-mode waveguides test structures were corrupted, they looked fine on my end. I removed them regardless, we can do the measurement on a future chip.
I added floorplans to the submitted files.