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Update chameo.ttl
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added terms for:
- DirectCurrentInternalResistance
- EnergyDispersiveXraySpectroscopy
- FourierTransformInfraredSpectroscopy
- ThreePointBendingTest
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jsimonclark committed Mar 7, 2024
1 parent d579d36 commit b1d8f3e
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39 changes: 39 additions & 0 deletions chameo.ttl
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Expand Up @@ -1408,6 +1408,13 @@ chameo:DirectCoulometryAtControlledPotential rdf:type owl:Class ;
skos:prefLabel "DirectCoulometryAtControlledPotential"@en .


### https://w3id.org/emmo/domain/chameo#DirectCurrentInternalResistance
chameo:DirectCurrentInternalResistance rdf:type owl:Class ;
rdfs:subClassOf chameo:Chronopotentiometry ;
skos:prefLabel "DirectCurrentInternalResistance"@en ;
emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current"@en .


### https://w3id.org/emmo/domain/chameo#DynamicLightScattering
chameo:DynamicLightScattering rdf:type owl:Class ;
rdfs:subClassOf chameo:Optical ;
Expand Down Expand Up @@ -1525,6 +1532,17 @@ can probe a range of properties including layer thickness, morphology, and chemi
skos:prefLabel "Ellipsometry"@en .


### https://w3id.org/emmo/domain/chameo#EnergyDispersiveXraySpectroscopy
chameo:EnergyDispersiveXraySpectroscopy rdf:type owl:Class ;
rdfs:subClassOf chameo:Spectroscopy ;
skos:altLabel "EDS"@en ,
"EDX"@en ;
skos:prefLabel "EnergyDispersiveXraySpectroscopy"@en ;
emmo:EMMO_26bf1bef_d192_4da6_b0eb_d2209698fb54 "https://www.wikidata.org/wiki/Q386334"@en ;
emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "an analytical technique used for the elemental analysis or chemical characterization of a sample"@en ;
emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy"@en .


### https://w3id.org/emmo/domain/chameo#EnvironmentalScanningElectronMicroscopy
chameo:EnvironmentalScanningElectronMicroscopy rdf:type owl:Class ;
rdfs:subClassOf chameo:Microscopy ;
Expand Down Expand Up @@ -1573,6 +1591,16 @@ chameo:FieldEmissionScanningElectronMicroscopy rdf:type owl:Class ;
skos:prefLabel "FieldEmissionScanningElectronMicroscopy"@en .


### https://w3id.org/emmo/domain/chameo#FourierTransformInfraredSpectroscopy
chameo:FourierTransformInfraredSpectroscopy rdf:type owl:Class ;
rdfs:subClassOf chameo:Spectroscopy ;
skos:altLabel "FTIR"@en ;
skos:prefLabel "FourierTransformInfraredSpectroscopy"@en ;
emmo:EMMO_26bf1bef_d192_4da6_b0eb_d2209698fb54 "https://www.wikidata.org/wiki/Q901559"@en ;
emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas"@en ;
emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Fourier-transform_infrared_spectroscopy"@en .


### https://w3id.org/emmo/domain/chameo#Fractography
chameo:Fractography rdf:type owl:Class ;
rdfs:subClassOf chameo:Optical ;
Expand Down Expand Up @@ -2543,6 +2571,17 @@ chameo:Thermogravimetry rdf:type owl:Class ;
skos:prefLabel "Thermogravimetry"@en .


### https://w3id.org/emmo/domain/chameo#ThreePointBendingTest
chameo:ThreePointBendingTest rdf:type owl:Class ;
rdfs:subClassOf chameo:Mechanical ;
skos:altLabel "ThreePointFlexuralTest"@en ;
skos:prefLabel "ThreePointBendingTest"@en ;
emmo:EMMO_26bf1bef_d192_4da6_b0eb_d2209698fb54 "https://www.wikidata.org/wiki/Q2300905"@en ;
emmo:EMMO_967080e5_2f42_4eb2_a3a9_c58143e835f9 "method of mechanical testing that provides values for the modulus of elasticity in bending, flexural stress, flexural strain, and the flexural stress–strain response of a material sample"@en ;
emmo:EMMO_c84c6752_6d64_48cc_9500_e54a3c34898d "https://en.wikipedia.org/wiki/Three-point_flexural_test"@en .



### https://w3id.org/emmo/domain/chameo#Tomography
chameo:Tomography rdf:type owl:Class ;
rdfs:subClassOf chameo:CharacterisationMethod ;
Expand Down

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