Skip to content

v0.21
Compare
Choose a tag to compare
@lukmuk lukmuk released this 08 Nov 17:15
v0.21
7d9b63a
This commit was created on GitHub.com and signed with GitHub’s verified signature. The key has expired.
GPG key ID: 4AEE18F83AFDEB23
Expired
Learn about vigilant mode.

  • Rewrote FEI_crop_scalebar.ijm to crop the FEI/TFS info bar based on the [Scan] VerFieldSize and [Scan]PixelHeight values. This should make the cropping work for every FEI/TFS machine as long as both values are found in the tiff metadata.

  • Added an legacy option to use "list-based" cropping as in the old v0.2 version in the FEI_crop_scalebar.ijm option menu (Use list from code for cropping value (legacy option)). Important: If your cropping does not work with the new version, copy your determined cropping values into the new if-clause in the code and activate the aforementioned menu option.

  • The Help is now found in a new drop-down menu.

  • A new function Set pixel size and unit was added to the drop-down menu. IT will fetch the values from the front-most image. You can then specify the values directly or use some special formats for electron microscopy from the Use special unit menu. The latter do not shown on my Windows system, but on Linux. Currently in the list: Å, Å^{-1}, and nm^{-1}.

  • Updated the readme.

Assets 2
Loading